碳纳米管SRAM电池优化的新曲线拟合设计方法

Wei Wang, K. Choi
{"title":"碳纳米管SRAM电池优化的新曲线拟合设计方法","authors":"Wei Wang, K. Choi","doi":"10.1109/EIT.2010.5612138","DOIUrl":null,"url":null,"abstract":"Unlike CMOS circuit design, even though there are promising advantages to use carbon nanotubes for digital circuits in terms of power, delay, temperature, and area, one of the critical issues to design by using carbon nanotubes is optimization of additional design parameters such as number of nanotubes and pitch size. To reduce the optimization complexity of the increased technology parameters, in this paper, we proposed a novel curve fitting design methodology for carbon-nanotube circuits. The proposed curve fitting methodology can guarantee from 90% to 100% correlation accuracy comparing with SPICE simulation and it can find optimal CNFET SRAM cell parameters without exhaustive simulation time and large memory space. The optimized CNFET SRAM cell by the proposed methodology shows that total power consumption including static power is reduced by 83.14% and the total PDP (product of delay and power) is reduced by 83.39%, comparing with CMOS SRAM cell design. The total runtime is reduced by 96.9% compared with conventional Monte Carlo simulation method in SPICE.","PeriodicalId":305049,"journal":{"name":"2010 IEEE International Conference on Electro/Information Technology","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Novel curve fitting design methodology for carbon nanotube SRAM cell optimization\",\"authors\":\"Wei Wang, K. Choi\",\"doi\":\"10.1109/EIT.2010.5612138\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Unlike CMOS circuit design, even though there are promising advantages to use carbon nanotubes for digital circuits in terms of power, delay, temperature, and area, one of the critical issues to design by using carbon nanotubes is optimization of additional design parameters such as number of nanotubes and pitch size. To reduce the optimization complexity of the increased technology parameters, in this paper, we proposed a novel curve fitting design methodology for carbon-nanotube circuits. The proposed curve fitting methodology can guarantee from 90% to 100% correlation accuracy comparing with SPICE simulation and it can find optimal CNFET SRAM cell parameters without exhaustive simulation time and large memory space. The optimized CNFET SRAM cell by the proposed methodology shows that total power consumption including static power is reduced by 83.14% and the total PDP (product of delay and power) is reduced by 83.39%, comparing with CMOS SRAM cell design. The total runtime is reduced by 96.9% compared with conventional Monte Carlo simulation method in SPICE.\",\"PeriodicalId\":305049,\"journal\":{\"name\":\"2010 IEEE International Conference on Electro/Information Technology\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-05-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE International Conference on Electro/Information Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EIT.2010.5612138\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Conference on Electro/Information Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EIT.2010.5612138","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11

摘要

与CMOS电路设计不同,尽管在功率、延迟、温度和面积方面使用碳纳米管在数字电路中有很好的优势,但使用碳纳米管设计的关键问题之一是优化额外的设计参数,如纳米管数量和节距尺寸。为了降低工艺参数增加带来的优化复杂度,本文提出了一种新的碳纳米管电路曲线拟合设计方法。与SPICE仿真相比,所提出的曲线拟合方法可以保证90% ~ 100%的相关精度,并且可以在不耗尽模拟时间和占用大量存储空间的情况下找到最优的CNFET SRAM单元参数。采用该方法优化的CNFET SRAM单元与CMOS SRAM单元相比,包括静态功耗在内的总功耗降低了83.14%,总PDP(延迟与功率的积)降低了83.39%。与传统的蒙特卡罗模拟方法相比,SPICE中总运行时间缩短了96.9%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Novel curve fitting design methodology for carbon nanotube SRAM cell optimization
Unlike CMOS circuit design, even though there are promising advantages to use carbon nanotubes for digital circuits in terms of power, delay, temperature, and area, one of the critical issues to design by using carbon nanotubes is optimization of additional design parameters such as number of nanotubes and pitch size. To reduce the optimization complexity of the increased technology parameters, in this paper, we proposed a novel curve fitting design methodology for carbon-nanotube circuits. The proposed curve fitting methodology can guarantee from 90% to 100% correlation accuracy comparing with SPICE simulation and it can find optimal CNFET SRAM cell parameters without exhaustive simulation time and large memory space. The optimized CNFET SRAM cell by the proposed methodology shows that total power consumption including static power is reduced by 83.14% and the total PDP (product of delay and power) is reduced by 83.39%, comparing with CMOS SRAM cell design. The total runtime is reduced by 96.9% compared with conventional Monte Carlo simulation method in SPICE.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信