基于HT46RU24的集成电路芯片测试仪的设计与应用

2021 International Symposium on Computer Technology and Information Science (ISCTIS) Pub Date : 2021-06-01 DOI:10.1109/ISCTIS51085.2021.00056

Baosen Xiao, Xiao-long Li, Yuhui Lin, Yao Zhang

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引用次数: 2

摘要

根据数字系统测试和可测试性原理，以HT46RU24单片机为核心，建立了固定故障模型。该仪器可在20个引脚内完成TTL系列和CMOS系列数字集成电路芯片的测试。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Design and Application of an IC Chip Test Instrument Based on HT46RU24

According to the principle of digital system test and testability, with the HT46RU24 microcontroller as the core, a fixed fault model is established. This instrument can complete the test of TTL series and CMOS series digital integrated circuit chips within 20 pins.

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来源期刊

2021 International Symposium on Computer Technology and Information Science (ISCTIS)

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