{"title":"60GHz堆叠注入锁定功率放大器","authors":"Ahmed S. Zamzam, M. El-Nozahi, H. Ragai","doi":"10.1109/WAMICON.2018.8363910","DOIUrl":null,"url":null,"abstract":"In this paper, technology fundamental limits on the performance of stacked and classical Class E power amplifiers are studied. A current combined stacked injection locking technique is proposed in order to enhance both the output power and power-added efficiency (PAE). Based on this technique, a 60 GHz fully differential stacked power amplifier is designed in 65nm CMOS bulk process. The simulation results show an output power of 19.5dBm and PAE of 15.5%.","PeriodicalId":193359,"journal":{"name":"2018 IEEE 19th Wireless and Microwave Technology Conference (WAMICON)","volume":"99 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A 60GHz stacked injection locking power amplifier\",\"authors\":\"Ahmed S. Zamzam, M. El-Nozahi, H. Ragai\",\"doi\":\"10.1109/WAMICON.2018.8363910\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, technology fundamental limits on the performance of stacked and classical Class E power amplifiers are studied. A current combined stacked injection locking technique is proposed in order to enhance both the output power and power-added efficiency (PAE). Based on this technique, a 60 GHz fully differential stacked power amplifier is designed in 65nm CMOS bulk process. The simulation results show an output power of 19.5dBm and PAE of 15.5%.\",\"PeriodicalId\":193359,\"journal\":{\"name\":\"2018 IEEE 19th Wireless and Microwave Technology Conference (WAMICON)\",\"volume\":\"99 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE 19th Wireless and Microwave Technology Conference (WAMICON)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/WAMICON.2018.8363910\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 19th Wireless and Microwave Technology Conference (WAMICON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WAMICON.2018.8363910","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In this paper, technology fundamental limits on the performance of stacked and classical Class E power amplifiers are studied. A current combined stacked injection locking technique is proposed in order to enhance both the output power and power-added efficiency (PAE). Based on this technique, a 60 GHz fully differential stacked power amplifier is designed in 65nm CMOS bulk process. The simulation results show an output power of 19.5dBm and PAE of 15.5%.
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