{"title":"多层LTCC基板中的毫米波电阻容差终端","authors":"T. Yuasa, Y. Tahara, N. Yoneda, H. Oh-Hashi","doi":"10.1587/TRANSELE.E94.C.321","DOIUrl":null,"url":null,"abstract":"A millimeter wave termination which is tolerant to the resistance error of the resistive film in a multi-layered LTCC substrate has been developed. The tolerance to the resistance error can be realized by a strip line bifurcation located outside the resistive film. It has been experimentally demonstrated that the reflection characteristic degradation by the resistance error of the proposed termination is reduced compared with the conventional one.","PeriodicalId":232128,"journal":{"name":"2009 European Microwave Conference (EuMC)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A millimeter-wave resistance error tolerant termination in multi-layered LTCC substrate\",\"authors\":\"T. Yuasa, Y. Tahara, N. Yoneda, H. Oh-Hashi\",\"doi\":\"10.1587/TRANSELE.E94.C.321\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A millimeter wave termination which is tolerant to the resistance error of the resistive film in a multi-layered LTCC substrate has been developed. The tolerance to the resistance error can be realized by a strip line bifurcation located outside the resistive film. It has been experimentally demonstrated that the reflection characteristic degradation by the resistance error of the proposed termination is reduced compared with the conventional one.\",\"PeriodicalId\":232128,\"journal\":{\"name\":\"2009 European Microwave Conference (EuMC)\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 European Microwave Conference (EuMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1587/TRANSELE.E94.C.321\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 European Microwave Conference (EuMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1587/TRANSELE.E94.C.321","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A millimeter-wave resistance error tolerant termination in multi-layered LTCC substrate
A millimeter wave termination which is tolerant to the resistance error of the resistive film in a multi-layered LTCC substrate has been developed. The tolerance to the resistance error can be realized by a strip line bifurcation located outside the resistive film. It has been experimentally demonstrated that the reflection characteristic degradation by the resistance error of the proposed termination is reduced compared with the conventional one.