多层LTCC基板中的毫米波电阻容差终端

T. Yuasa, Y. Tahara, N. Yoneda, H. Oh-Hashi
{"title":"多层LTCC基板中的毫米波电阻容差终端","authors":"T. Yuasa, Y. Tahara, N. Yoneda, H. Oh-Hashi","doi":"10.1587/TRANSELE.E94.C.321","DOIUrl":null,"url":null,"abstract":"A millimeter wave termination which is tolerant to the resistance error of the resistive film in a multi-layered LTCC substrate has been developed. The tolerance to the resistance error can be realized by a strip line bifurcation located outside the resistive film. It has been experimentally demonstrated that the reflection characteristic degradation by the resistance error of the proposed termination is reduced compared with the conventional one.","PeriodicalId":232128,"journal":{"name":"2009 European Microwave Conference (EuMC)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A millimeter-wave resistance error tolerant termination in multi-layered LTCC substrate\",\"authors\":\"T. Yuasa, Y. Tahara, N. Yoneda, H. Oh-Hashi\",\"doi\":\"10.1587/TRANSELE.E94.C.321\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A millimeter wave termination which is tolerant to the resistance error of the resistive film in a multi-layered LTCC substrate has been developed. The tolerance to the resistance error can be realized by a strip line bifurcation located outside the resistive film. It has been experimentally demonstrated that the reflection characteristic degradation by the resistance error of the proposed termination is reduced compared with the conventional one.\",\"PeriodicalId\":232128,\"journal\":{\"name\":\"2009 European Microwave Conference (EuMC)\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 European Microwave Conference (EuMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1587/TRANSELE.E94.C.321\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 European Microwave Conference (EuMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1587/TRANSELE.E94.C.321","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

研制了一种能容忍多层LTCC衬底中电阻膜电阻误差的毫米波终端。对电阻误差的容忍可以通过位于电阻膜外的带状线分岔来实现。实验证明,与传统端接器相比,该端接器的电阻误差对反射特性的影响较小。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A millimeter-wave resistance error tolerant termination in multi-layered LTCC substrate
A millimeter wave termination which is tolerant to the resistance error of the resistive film in a multi-layered LTCC substrate has been developed. The tolerance to the resistance error can be realized by a strip line bifurcation located outside the resistive film. It has been experimentally demonstrated that the reflection characteristic degradation by the resistance error of the proposed termination is reduced compared with the conventional one.
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