{"title":"用于导电发射测试的射频注入网络中心频率处具有20 dB改进抑制的集总元件射频低通滤波器","authors":"A. Attaran, W. Handler, B. Chronik","doi":"10.1109/CCECE.2019.8861975","DOIUrl":null,"url":null,"abstract":"In this work, a modified low pass filter with 20 dB improved rejection at the center frequency of the RF injection network was developed to monitor the RF rectification of an active implantable medical devices (AIMD) during conductive emission testing. Transfer function of the designed filter was calculated, verified and validated by ADS simulation and S-parameter measurement using RF network analyzer. Analytical calculation, simulation and measurement results of the filter transfer function are in good agreement.","PeriodicalId":352860,"journal":{"name":"2019 IEEE Canadian Conference of Electrical and Computer Engineering (CCECE)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Lumped Element RF Low Pass Filter with 20 dB Improved Suppression at the Center Frequency of an RF Injection Network for Conductive Emission Testing\",\"authors\":\"A. Attaran, W. Handler, B. Chronik\",\"doi\":\"10.1109/CCECE.2019.8861975\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, a modified low pass filter with 20 dB improved rejection at the center frequency of the RF injection network was developed to monitor the RF rectification of an active implantable medical devices (AIMD) during conductive emission testing. Transfer function of the designed filter was calculated, verified and validated by ADS simulation and S-parameter measurement using RF network analyzer. Analytical calculation, simulation and measurement results of the filter transfer function are in good agreement.\",\"PeriodicalId\":352860,\"journal\":{\"name\":\"2019 IEEE Canadian Conference of Electrical and Computer Engineering (CCECE)\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-05-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE Canadian Conference of Electrical and Computer Engineering (CCECE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CCECE.2019.8861975\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE Canadian Conference of Electrical and Computer Engineering (CCECE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCECE.2019.8861975","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Lumped Element RF Low Pass Filter with 20 dB Improved Suppression at the Center Frequency of an RF Injection Network for Conductive Emission Testing
In this work, a modified low pass filter with 20 dB improved rejection at the center frequency of the RF injection network was developed to monitor the RF rectification of an active implantable medical devices (AIMD) during conductive emission testing. Transfer function of the designed filter was calculated, verified and validated by ADS simulation and S-parameter measurement using RF network analyzer. Analytical calculation, simulation and measurement results of the filter transfer function are in good agreement.