{"title":"600V反向阻断IGBT器件动态特性评估","authors":"O. Korkh, A. Blinov","doi":"10.1109/AIEEE.2017.8270527","DOIUrl":null,"url":null,"abstract":"This paper presents an overview and analysis of operation of RB IGBT transistors. The series of experiments is devoted characterisation of 600 V, 85 A RB IGBT devices under hard and soft switching conditions using a double-pulse test circuit. The switching behaviour, particularly turn-on and turn-off characteristics, of these devices under various conditions are evaluated. Obtained results allow to assess the impact of reverse recovery process on the turn-on losses and compare the characteristic of RB IGBTs with various types of discrete diodes.","PeriodicalId":224275,"journal":{"name":"2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Dynamic characteristic evaluation of a 600V reverse blocking IGBT device\",\"authors\":\"O. Korkh, A. Blinov\",\"doi\":\"10.1109/AIEEE.2017.8270527\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an overview and analysis of operation of RB IGBT transistors. The series of experiments is devoted characterisation of 600 V, 85 A RB IGBT devices under hard and soft switching conditions using a double-pulse test circuit. The switching behaviour, particularly turn-on and turn-off characteristics, of these devices under various conditions are evaluated. Obtained results allow to assess the impact of reverse recovery process on the turn-on losses and compare the characteristic of RB IGBTs with various types of discrete diodes.\",\"PeriodicalId\":224275,\"journal\":{\"name\":\"2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE)\",\"volume\":\"34 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AIEEE.2017.8270527\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AIEEE.2017.8270527","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Dynamic characteristic evaluation of a 600V reverse blocking IGBT device
This paper presents an overview and analysis of operation of RB IGBT transistors. The series of experiments is devoted characterisation of 600 V, 85 A RB IGBT devices under hard and soft switching conditions using a double-pulse test circuit. The switching behaviour, particularly turn-on and turn-off characteristics, of these devices under various conditions are evaluated. Obtained results allow to assess the impact of reverse recovery process on the turn-on losses and compare the characteristic of RB IGBTs with various types of discrete diodes.