芯片级原子束:芯片上量子器件的前景

{"title":"芯片级原子束:芯片上量子器件的前景","authors":"C. Raman","doi":"10.1117/12.2617006","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":112075,"journal":{"name":"Optical and Quantum Sensing and Precision Metrology II","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-03-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Chip-scale atomic beams: prospects for quantum devices on chip\",\"authors\":\"C. Raman\",\"doi\":\"10.1117/12.2617006\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":112075,\"journal\":{\"name\":\"Optical and Quantum Sensing and Precision Metrology II\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-03-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optical and Quantum Sensing and Precision Metrology II\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2617006\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical and Quantum Sensing and Precision Metrology II","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2617006","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}