{"title":"关于批次不合格率Beta分布的说明","authors":"J. Chimka","doi":"10.1515/eqc-2015-0010","DOIUrl":null,"url":null,"abstract":"Abstract In this note I use MIL-STD-414 for contrast and comparison with an alternate way to estimate the distribution of lot percent defective. A slight deviation from traditional distribution assumption parameters affects results associated with an enduring example of double specification limits.","PeriodicalId":360039,"journal":{"name":"Economic Quality Control","volume":"155 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Note on the Beta Distribution of Lot Percent Defective\",\"authors\":\"J. Chimka\",\"doi\":\"10.1515/eqc-2015-0010\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Abstract In this note I use MIL-STD-414 for contrast and comparison with an alternate way to estimate the distribution of lot percent defective. A slight deviation from traditional distribution assumption parameters affects results associated with an enduring example of double specification limits.\",\"PeriodicalId\":360039,\"journal\":{\"name\":\"Economic Quality Control\",\"volume\":\"155 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Economic Quality Control\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1515/eqc-2015-0010\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Economic Quality Control","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1515/eqc-2015-0010","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Note on the Beta Distribution of Lot Percent Defective
Abstract In this note I use MIL-STD-414 for contrast and comparison with an alternate way to estimate the distribution of lot percent defective. A slight deviation from traditional distribution assumption parameters affects results associated with an enduring example of double specification limits.