大功率碳化硅肖特基势垒二极管技术研究

Wang Zuchuan, Yao Haiting, Wu Xiaoye
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引用次数: 0

摘要

本文从SiC材料的质量和类型选择、SBD器件的结构和SiC器件的制造工艺三个方面报道了大功率碳化硅肖特基势垒二极管(SiC SBD)的研究成果。详细分析了制备SiC SBD的关键工艺,即p型离子注入活化工艺、欧姆接触工艺、肖特基金属制备工艺和钝化层制备工艺。本文介绍了耐电压1200V、电流密度大于120A/cm2、结电容小于0.4pf的SiC SBD的制备方法,提出了制备大功率SiC SBD的新技术路线和工艺流程。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Technical Research on High Power Silicon Carbide Schottky Barrier Diode
This paper reports the research results of high power silicon carbide Schottky barrier diode (SiC SBD) in three aspects, namely the quality and type selection of SiC materials, device structure of SBD and the manufacturing process of SiC devices. Besides, the key processes of manufacturing SiC SBD, i.e. p-type ion implantation and activation process, ohmic contact process, Schottky metal preparation process, and passivation layer preparation process, are analyzed in detail. The paper introduces the preparation method of SiC SBD with a withstand voltage of 1200V, a current density of more than 120A/cm2 and a junction capacitance of less than 0.4pf, proposing a new technical route and process flow for preparation of high-power SiC SBD.
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