{"title":"GaAs器件在欧洲的活动","authors":"W. Baechtold","doi":"10.1109/MWSYM.1988.22115","DOIUrl":null,"url":null,"abstract":"This survey of European GaAs device activities focuses on GaAs MESFETs, HEMTs, and GaInAs JFETs. In all areas significant progress is noted and attributed to advanced processing methods. In the case of the GaInAs JFET, outstanding device results are cited. It is felt that the technology, however, is presently suited to very simple integrated circuits only and that of tools and processes similar to those for MESFETs are needed similar levels of integration to become feasible.<<ETX>>","PeriodicalId":339513,"journal":{"name":"1988., IEEE MTT-S International Microwave Symposium Digest","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"GaAs device activities in Europe\",\"authors\":\"W. Baechtold\",\"doi\":\"10.1109/MWSYM.1988.22115\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This survey of European GaAs device activities focuses on GaAs MESFETs, HEMTs, and GaInAs JFETs. In all areas significant progress is noted and attributed to advanced processing methods. In the case of the GaInAs JFET, outstanding device results are cited. It is felt that the technology, however, is presently suited to very simple integrated circuits only and that of tools and processes similar to those for MESFETs are needed similar levels of integration to become feasible.<<ETX>>\",\"PeriodicalId\":339513,\"journal\":{\"name\":\"1988., IEEE MTT-S International Microwave Symposium Digest\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-05-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1988., IEEE MTT-S International Microwave Symposium Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.1988.22115\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1988., IEEE MTT-S International Microwave Symposium Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1988.22115","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This survey of European GaAs device activities focuses on GaAs MESFETs, HEMTs, and GaInAs JFETs. In all areas significant progress is noted and attributed to advanced processing methods. In the case of the GaInAs JFET, outstanding device results are cited. It is felt that the technology, however, is presently suited to very simple integrated circuits only and that of tools and processes similar to those for MESFETs are needed similar levels of integration to become feasible.<>