Zhen Cao, B. Duan, Song Yuan, Haijun Guo, Jianmei Lv, Tongtong Shi, Yintang Yang
{"title":"新型多浮埋层超结LDMOS","authors":"Zhen Cao, B. Duan, Song Yuan, Haijun Guo, Jianmei Lv, Tongtong Shi, Yintang Yang","doi":"10.23919/ISPSD.2017.7988959","DOIUrl":null,"url":null,"abstract":"In this paper, a novel superjunction lateral double-diffused MOSFET (SJ-LDMOS) based on the bulk electric field modulation is proposed. The new structure is characterized by adding the multiple floating buried layers (MFBL) into the substrate/epitaxial layer. In this way, the high bulk electric field under the drain diffusion edge is reduced and the overall bulk electric field distribution is optimized. In addition, the N+/P-substrate junction and the auxiliary MFBL/substrate junctions jointly sustain a high breakdown voltage (BV). Simulated results show that the BV of MFBL SJ-LDMOS is improved by about 80.4% than that of the buffered step doping (BSD) SJ-LDMOS with the same drift region length. Furthermore, compared with the N-type buffered SJ-LDMOS the BV of MFBL SJ-LDMOS significantly increases by 131.7%. Moreover, the power figure-of-merit (FOM=BV2/RON, sp) of MFBL SJ-LDMOS reaches 13.07 MW/cm2 with the excellent performance breaking the silicon limit.","PeriodicalId":202561,"journal":{"name":"2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Novel superjunction LDMOS with multi-floating buried layers\",\"authors\":\"Zhen Cao, B. Duan, Song Yuan, Haijun Guo, Jianmei Lv, Tongtong Shi, Yintang Yang\",\"doi\":\"10.23919/ISPSD.2017.7988959\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a novel superjunction lateral double-diffused MOSFET (SJ-LDMOS) based on the bulk electric field modulation is proposed. The new structure is characterized by adding the multiple floating buried layers (MFBL) into the substrate/epitaxial layer. In this way, the high bulk electric field under the drain diffusion edge is reduced and the overall bulk electric field distribution is optimized. In addition, the N+/P-substrate junction and the auxiliary MFBL/substrate junctions jointly sustain a high breakdown voltage (BV). Simulated results show that the BV of MFBL SJ-LDMOS is improved by about 80.4% than that of the buffered step doping (BSD) SJ-LDMOS with the same drift region length. Furthermore, compared with the N-type buffered SJ-LDMOS the BV of MFBL SJ-LDMOS significantly increases by 131.7%. Moreover, the power figure-of-merit (FOM=BV2/RON, sp) of MFBL SJ-LDMOS reaches 13.07 MW/cm2 with the excellent performance breaking the silicon limit.\",\"PeriodicalId\":202561,\"journal\":{\"name\":\"2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD)\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/ISPSD.2017.7988959\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/ISPSD.2017.7988959","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Novel superjunction LDMOS with multi-floating buried layers
In this paper, a novel superjunction lateral double-diffused MOSFET (SJ-LDMOS) based on the bulk electric field modulation is proposed. The new structure is characterized by adding the multiple floating buried layers (MFBL) into the substrate/epitaxial layer. In this way, the high bulk electric field under the drain diffusion edge is reduced and the overall bulk electric field distribution is optimized. In addition, the N+/P-substrate junction and the auxiliary MFBL/substrate junctions jointly sustain a high breakdown voltage (BV). Simulated results show that the BV of MFBL SJ-LDMOS is improved by about 80.4% than that of the buffered step doping (BSD) SJ-LDMOS with the same drift region length. Furthermore, compared with the N-type buffered SJ-LDMOS the BV of MFBL SJ-LDMOS significantly increases by 131.7%. Moreover, the power figure-of-merit (FOM=BV2/RON, sp) of MFBL SJ-LDMOS reaches 13.07 MW/cm2 with the excellent performance breaking the silicon limit.