{"title":"多千兆I/O接口的功率分配分析方法","authors":"R. Schmitt, X. Huang, C. Yuan","doi":"10.1109/EPEP.2003.1250018","DOIUrl":null,"url":null,"abstract":"As the operating frequency of I/O circuits increases and voltage swing decreases, it becomes increasingly important to verify the power distribution network (PDN). This paper presents a methodology used to design and verify the PDN for a multi-gigabit memory interfaces. It describes the modeling of PDN components, the necessary analysis steps to assist in the design of a high-quality PDN, and the simulations to predict the impact of supply noise on the signal quality in the memory channel.","PeriodicalId":254477,"journal":{"name":"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)","volume":"94 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Power distribution analysis methodology for a multi-gigabit I/O interface\",\"authors\":\"R. Schmitt, X. Huang, C. Yuan\",\"doi\":\"10.1109/EPEP.2003.1250018\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As the operating frequency of I/O circuits increases and voltage swing decreases, it becomes increasingly important to verify the power distribution network (PDN). This paper presents a methodology used to design and verify the PDN for a multi-gigabit memory interfaces. It describes the modeling of PDN components, the necessary analysis steps to assist in the design of a high-quality PDN, and the simulations to predict the impact of supply noise on the signal quality in the memory channel.\",\"PeriodicalId\":254477,\"journal\":{\"name\":\"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)\",\"volume\":\"94 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-12-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.2003.1250018\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2003.1250018","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Power distribution analysis methodology for a multi-gigabit I/O interface
As the operating frequency of I/O circuits increases and voltage swing decreases, it becomes increasingly important to verify the power distribution network (PDN). This paper presents a methodology used to design and verify the PDN for a multi-gigabit memory interfaces. It describes the modeling of PDN components, the necessary analysis steps to assist in the design of a high-quality PDN, and the simulations to predict the impact of supply noise on the signal quality in the memory channel.