用于辐射硬度确认的电子元件飞行试验结果的问题和特殊方面

G. Protopopov, V. Anashin, N. Balykina, A. Repin, V. Denisova, A. V. Tsurgaev
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引用次数: 0

摘要

通过对不同轨道空间辐射环境的机载测量,指出了电子元件飞行试验结果使用的问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Issues and Special Aspects of Electronic Component Flight Test Results Usage for Radiation Hardness Confirmation
Issues of electronic component flight test results usage are shown in the paper using onboard measurements of space radiation environments in different orbits.
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