{"title":"低温介质损耗的量热测量","authors":"C. King, R. A. Thomas","doi":"10.1109/CEIDP.1975.7736648","DOIUrl":null,"url":null,"abstract":"Most dielectric loss measurements are made by using a capacitance bridge. Bridge methods however require standard capacitors. These capacitors have dielectric loss tangents of about 10−5 and loss tangents smaller than this cannot easily be measured with bridge techniques. Furthermore, the measurement is a relative rather than an absolute one, and thus its precision is dependent on how precisely the loss of the standard capacitor is known.1","PeriodicalId":121906,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1975","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1975-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The calorimetric measurement of low temperature dielectric loss\",\"authors\":\"C. King, R. A. Thomas\",\"doi\":\"10.1109/CEIDP.1975.7736648\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Most dielectric loss measurements are made by using a capacitance bridge. Bridge methods however require standard capacitors. These capacitors have dielectric loss tangents of about 10−5 and loss tangents smaller than this cannot easily be measured with bridge techniques. Furthermore, the measurement is a relative rather than an absolute one, and thus its precision is dependent on how precisely the loss of the standard capacitor is known.1\",\"PeriodicalId\":121906,\"journal\":{\"name\":\"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1975\",\"volume\":\"48 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1975-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1975\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP.1975.7736648\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1975","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.1975.7736648","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The calorimetric measurement of low temperature dielectric loss
Most dielectric loss measurements are made by using a capacitance bridge. Bridge methods however require standard capacitors. These capacitors have dielectric loss tangents of about 10−5 and loss tangents smaller than this cannot easily be measured with bridge techniques. Furthermore, the measurement is a relative rather than an absolute one, and thus its precision is dependent on how precisely the loss of the standard capacitor is known.1