5G毫米波设备空中测试的可行性和挑战

Suma G. Pannala
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引用次数: 8

摘要

从1G到5G蜂窝技术的演进主要是由对无线生态系统中速度、低延迟、高可靠性和增强使用灵活性的永不满足的需求推动的。使用多天线结合复杂的调制方案使得每一代蜂窝技术都比前一代技术有了增强。5G技术旨在利用以前未知的更高毫米波(mmWave)频率和更大带宽,实现更大数据吞吐量的目标,同时增强数据可靠性并减少延迟。毫米波信号的小波长使得使用几个具有小元元间距的多元相控阵天线设计5G设备成为可能。然而,与2G/3G/4G设备的天线设计不同,5G多元素天线将与5G设备的射频集成电路(RFIC)板集成。天线和RFIC之间的紧密集成使得被测设备(DUT)的天线端口无法使用电缆/连接器与测试设备进行物理连接。由于无法通过电缆进行测试,因此对5G毫米波设备的验证必须进行无线辐射(OTA)测试。本文旨在评估候选OTA测试方法满足5G毫米波测试需求的可行性。本文阐述了在空中测试5G毫米波设备的挑战,并讨论了克服这些挑战的替代OTA测试解决方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Feasibility and Challenges of Over-The-Air Testing for 5G Millimeter Wave Devices
The evolution from 1G through 5G cellular technologies has been fueled mainly by the insatiable need for speed, lower latency, high reliability and enhanced flexibility of use across the wireless ecosystem. Using multiple antennas in conjunction with complex modulation schemes has rendered each generation of cellular technology an enhanced version over its former counterpart. 5G technology aims to exploit previously unchartered higher millimeter wave (mmWave) frequencies & larger bandwidths towards realizing the goal of greater data throughput, while simultaneously enhancing data reliability and reducing latency. The small wavelength of mmWave signals makes it possible to design 5G devices using several multi-element phased array antennas with small element-element spacing. However, unlike the antenna designs of 2G/3G/4G devices, 5G multi-element antennas would be integrated with the radio frequency integrated circuit (RFIC) board of the 5G device. The tight integration between antennas and RFIC renders the antenna port of the device under test (DUT) inaccessible for physical connections using cables/connectors to the test equipment. Since conducted testing with cables is not feasible anymore, radiated over-the-air (OTA) testing becomes mandatory for 5G mmWave device verification.This paper aims to assess the feasibility of candidate OTA test methods for 5G mmWave test requirements. The challenges of testing 5G mmWave devices over-the-air have been elucidated and alternative OTA test solutions for overcoming these challenges have also been discussed.
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