32 Gb/s通道中接收端经路到走线耦合引脚区域路由的NEXT效应

2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) Pub Date : 2022-10-09 DOI:10.1109/EPEPS53828.2022.9947103

P. Paladhi, Yanyan Zhang, Xianbo Yang, N. Pham, Megan Nguyen, M. Bohra, Junyan Tang, S. Chun, Joshua Myers, W. Becker, D. Dreps

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引用次数: 0

摘要

随着每一代带宽的增加和传输数据速率的提高，主板特别是模块区域下的路由密度也成比例地增加。在如此密集的路由条件下保持高速通道的信号完整性在每一代新产品中都变得越来越具有挑战性。本文展示了在LGA区域下通过跟踪耦合如何导致NEXT值增加，从而导致高数据速率下的信道裕度损失和故障。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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NEXT Effect in Pin-area Routing at Receiver End from Via to Trace Coupling in a 32 Gb/s Channel

With increasing bandwidth and higher transmission data rates in each generation, routing density in motherboards especially under module area have also increased proportionally. Maintaining signal integrity of high-speed channels under such dense routing conditions is becoming more challenging in each new product generation. This paper shows how via to trace coupling in under LGA area can give rise to increased NEXT values thereby causing channel margin loss and failure at high data rates.

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2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)

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