High Sensitivity Resonant X-band Thin Film Magneto-dielectric SIW Sensor

A thin film dielectric and magneto-dielectric X- band sensing using the substrate integrated waveguide (SIW) is proposed. The sensor is designed by etching a complementary split ring resonator (CSRR) at the center of the SIW waveguide E-plane. The designed resonant sensor structure facilitates the testing of samples without a need for fitting them precisely inside the SIW cavity. Moreover, the presence of maximum electric field at the center of E-plane helps to achieve the relatively higher perturbation and hence higher sensitivity. The Q-factor (107) and sensitivity (12.3%) of the designed sensor is found to be relatively higher than the microstrip counterpart (8.9%, 54). The developed sensor is experimentally tested for the number of standard test specimens, and the results are in good agreement with their reference values.