含氟聚合物电晕驻极体近表层深层陷阱的形成

V. G. Boitsov, A. Rychkov, V.V. Schvetz
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引用次数: 0

摘要

仅给出摘要形式,如下。非极性含氟聚合物电晕驻极体中正电荷的稳定性是由于聚合物的表面状态。驻极体稳定性可以通过改变薄的近表面介电层中的捕获能级谱来控制。研究了含氟聚合物电介质在极化前和驻极体态形成过程中深阱的形成方法。结果表明,含氟聚合物介质中正电荷深阱的形成主要取决于吸附过程的持续时间。表面态光谱中深阱的比例随着处理时间的延长而增加。在处理最初带正电荷的薄膜或在处理过程中表面的摩擦活化期间,这一过程大大加强。在此模型概念的基础上,确定了聚合物近表面捕获层的能谱,并建立了能谱与表面结构的关系
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The formation of deep traps in the near surface layers of fluoropolymer corona electrets
Summary form only given, as follows. The stability of a positive homocharge in nonpolar fluoropolymer corona electrets is due to the polymer surface states. Electret stability can be controlled by changing the trapping-level spectrum in the thin, near-surface dielectric layers. The methods of formation of deep traps in fluoropolymer dielectrics before polarization and in the process of the electret state formation are considered. It is shown that the formation of deep traps for the positive homocharge in fluoropolymer dielectrics essentially depends on the duration of the adsorption process. The fraction of deep traps in the surface-state spectrum increases with duration of treatment. This process is considerably intensified during the treatment of films initially charged by positive homocharge or during triboactivation of surface in the process of treatment. On the basis of the model conceptions the energy spectrum of near-surface trap layers of polymer is determined, and the correlation of the spectrum with the surface structure is established.<>
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