{"title":"基于波长快速扫描声光可调谐滤波器的VLSI dram电容槽深测量新系统","authors":"K. Takada, J. Noda, S. Nakajima","doi":"10.1109/CPEM.1988.671295","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"New Trench Depth Measurement System with Wavelength-Rapidly-Scanning Acousto-Optic Tunable Filter for VLSI DRAMs Capacitor Cells\",\"authors\":\"K. Takada, J. Noda, S. Nakajima\",\"doi\":\"10.1109/CPEM.1988.671295\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":326579,\"journal\":{\"name\":\"1988 Conference on Precision Electromagnetic Measurements\",\"volume\":\"35 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-06-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1988 Conference on Precision Electromagnetic Measurements\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CPEM.1988.671295\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1988 Conference on Precision Electromagnetic Measurements","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.1988.671295","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}