系统级ESD测试的时域近场测量技术与仿真

Cheng-tao Li, Che-Yu Liu, S. Wu, Sheng-Wei Guan, Ming-Shan Lin, Chia-Hung Su
{"title":"系统级ESD测试的时域近场测量技术与仿真","authors":"Cheng-tao Li, Che-Yu Liu, S. Wu, Sheng-Wei Guan, Ming-Shan Lin, Chia-Hung Su","doi":"10.1109/iWEM49354.2020.9237414","DOIUrl":null,"url":null,"abstract":"In this paper, time domain near field measurement for system level ESD (electrostatic discharge) is to solve temporary failures in ESD testing. First, this paper measure the waveform of ESD by oscilloscope then use simulation tools to create the model of ESD gun and nearfield simulation result. Finally, we use time domain near field measurement system to measure the sample and compare with simulation result.","PeriodicalId":201518,"journal":{"name":"2020 International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Time domain Near-Field Measurement Technology and Simulation for System Level ESD Testing\",\"authors\":\"Cheng-tao Li, Che-Yu Liu, S. Wu, Sheng-Wei Guan, Ming-Shan Lin, Chia-Hung Su\",\"doi\":\"10.1109/iWEM49354.2020.9237414\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, time domain near field measurement for system level ESD (electrostatic discharge) is to solve temporary failures in ESD testing. First, this paper measure the waveform of ESD by oscilloscope then use simulation tools to create the model of ESD gun and nearfield simulation result. Finally, we use time domain near field measurement system to measure the sample and compare with simulation result.\",\"PeriodicalId\":201518,\"journal\":{\"name\":\"2020 International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-08-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/iWEM49354.2020.9237414\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/iWEM49354.2020.9237414","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文提出了系统级静电放电的时域近场测量方法,以解决静电放电测试中的暂时性失效问题。本文首先利用示波器对静电放电波形进行测量,然后利用仿真工具建立静电放电枪的模型并给出近场仿真结果。最后,利用时域近场测量系统对样品进行了测量,并与仿真结果进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Time domain Near-Field Measurement Technology and Simulation for System Level ESD Testing
In this paper, time domain near field measurement for system level ESD (electrostatic discharge) is to solve temporary failures in ESD testing. First, this paper measure the waveform of ESD by oscilloscope then use simulation tools to create the model of ESD gun and nearfield simulation result. Finally, we use time domain near field measurement system to measure the sample and compare with simulation result.
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