基于WTM的组合测试向量和输出响应重排序,采用Dijkstra算法降低扫描功率

H. Parmar, S. Ruparelia, U. Mehta
{"title":"基于WTM的组合测试向量和输出响应重排序,采用Dijkstra算法降低扫描功率","authors":"H. Parmar, S. Ruparelia, U. Mehta","doi":"10.1109/NUICONE.2011.6153276","DOIUrl":null,"url":null,"abstract":"Test power has become a serious problem with scan-based testing. It can lead to prohibitive test power in the process of test application. During the process of scan shifting, the states of the flip-flops are changing continually, which causes excessive switching activities. Test vector reordering for reducing scan in scan out power is one of the general goal of low power testing. In this paper Dijakstra algorithm is proposed to reorder the test vectors in an optimal manner to minimize switching activity during testing. Here, by passing the test vectors through output response a weighted transition matrix(WTM) is calculated, and then Dijkstra algorithm is applied which helps to reduce switching activities. The experimental results on ISCAS benchmark circuit proves that the proposed algorithm gives an average of 39.95% reduction in switching.","PeriodicalId":206392,"journal":{"name":"2011 Nirma University International Conference on Engineering","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"WTM based reordering of combine test vector & output response using Dijkstra algorithm for scan power reduction\",\"authors\":\"H. Parmar, S. Ruparelia, U. Mehta\",\"doi\":\"10.1109/NUICONE.2011.6153276\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Test power has become a serious problem with scan-based testing. It can lead to prohibitive test power in the process of test application. During the process of scan shifting, the states of the flip-flops are changing continually, which causes excessive switching activities. Test vector reordering for reducing scan in scan out power is one of the general goal of low power testing. In this paper Dijakstra algorithm is proposed to reorder the test vectors in an optimal manner to minimize switching activity during testing. Here, by passing the test vectors through output response a weighted transition matrix(WTM) is calculated, and then Dijkstra algorithm is applied which helps to reduce switching activities. The experimental results on ISCAS benchmark circuit proves that the proposed algorithm gives an average of 39.95% reduction in switching.\",\"PeriodicalId\":206392,\"journal\":{\"name\":\"2011 Nirma University International Conference on Engineering\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 Nirma University International Conference on Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NUICONE.2011.6153276\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 Nirma University International Conference on Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NUICONE.2011.6153276","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

测试功率已经成为基于扫描的测试的一个严重问题。在测试应用过程中会导致测试功率过高。在扫描移位过程中,触发器的状态不断变化,导致开关活动过多。为了降低扫描输入和扫描输出功率而对测试向量进行重排序是低功耗测试的总体目标之一。本文提出了Dijakstra算法,以最优方式对测试向量进行重新排序,以最小化测试过程中的切换活动。该方法通过输出响应传递测试向量,计算加权转移矩阵(WTM),然后应用Dijkstra算法减少切换活动。在ISCAS基准电路上的实验结果表明,该算法平均减少了39.95%的切换次数。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
WTM based reordering of combine test vector & output response using Dijkstra algorithm for scan power reduction
Test power has become a serious problem with scan-based testing. It can lead to prohibitive test power in the process of test application. During the process of scan shifting, the states of the flip-flops are changing continually, which causes excessive switching activities. Test vector reordering for reducing scan in scan out power is one of the general goal of low power testing. In this paper Dijakstra algorithm is proposed to reorder the test vectors in an optimal manner to minimize switching activity during testing. Here, by passing the test vectors through output response a weighted transition matrix(WTM) is calculated, and then Dijkstra algorithm is applied which helps to reduce switching activities. The experimental results on ISCAS benchmark circuit proves that the proposed algorithm gives an average of 39.95% reduction in switching.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信