GOES-16高级基线成像仪(ABI)与高空飞机扫描高分辨率干涉仪测深仪(S-HIS)标定验证

Optical Sensors and Sensing Congress (ES, FTS, HISE, Sensors) Pub Date : 2019-06-25 DOI:10.1364/FTS.2019.FTU2B.2

Joe K. Taylor, D. Tobin, H. Revercomb, F. Best, R. Garcia, B. Knuteson, M. Feltz, F. Padula, Steve Goodman

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引用次数: 2

摘要

摘要介绍了2017年GOES-16校准验证活动期间使用基于飞机的扫描高分辨率干涉仪测深仪(S-HIS)进行的GOES-16高级基线成像仪(ABI)辐射校准验证评估。

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Calibration Validation of the GOES-16 Advanced Baseline Imager (ABI) with the High-Altitude Aircraft Based Scanning High-resolution Interferometer Sounder (S-HIS)

A summary of the GOES-16 Advanced Baseline Imager (ABI) radiometric calibration validation assessment conducted using the aircraft-based Scanning High-resolution Interferometer Sounder (S-HIS) during the 2017 GOES-16 calibration validation campaign is presented.

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Optical Sensors and Sensing Congress (ES, FTS, HISE, Sensors)

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