来自2017年突变主席的信息

ICST Workshops Pub Date : 2017-03-01 DOI:10.1109/ICSTW.2017.22

J. Krinke, Nan Li, J. Rojas

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引用次数: 0

摘要

我们很高兴欢迎您参加第12届突变分析国际研讨会(Mutation 2017)，该研讨会与在日本东京举行的第10届IEEE软件测试、验证和验证国际会议(ICST 2017)同时举行。自第一版以来，突变研讨会提供了一个论坛，汇集了研究人员和从业者，使他们能够交流思想，解决突变测试中的基本挑战，并讨论突变的新应用。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Message from the Mutation 2017 Chairs

It is our pleasure to welcome you to the 12th edition of the International Workshop on Mutation Analysis (Mutation 2017), collocated with the 10th IEEE International Conference on Software Testing, Verification and Validation (ICST 2017) in Tokyo, Japan. Since its first edition, the Mutation workshop has provided a forum to bring together researchers and practitioners, enabling them to exchange ideas, address fundamental challenges in mutation testing, and discuss new applications of mutation.

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ICST Workshops

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