类:片上轻量级精确的SEU/SET事件分类器

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI:10.1109/radecs47380.2019.9745655

Sébastien Thomet, S. De Paoli, Fakhreddine Ghaffari, F. Abouzeid, Olivier Romain, P. Roche

{"title":"类:片上轻量级精确的SEU/SET事件分类器","authors":"Sébastien Thomet, S. De Paoli, Fakhreddine Ghaffari, F. Abouzeid, Olivier Romain, P. Roche","doi":"10.1109/radecs47380.2019.9745655","DOIUrl":null,"url":null,"abstract":"This paper presents an on-chip error classifier for Soft-Error Rate characterization of cells under radiations. Implemented on top of flip-flop chains, it counts Single-Event Upset and Single-Event Transient at mission profile.","PeriodicalId":269018,"journal":{"name":"2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"CLASS: on-Chip Lightweight Accurate SEU/SET event claSSifier\",\"authors\":\"Sébastien Thomet, S. De Paoli, Fakhreddine Ghaffari, F. Abouzeid, Olivier Romain, P. Roche\",\"doi\":\"10.1109/radecs47380.2019.9745655\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an on-chip error classifier for Soft-Error Rate characterization of cells under radiations. Implemented on top of flip-flop chains, it counts Single-Event Upset and Single-Event Transient at mission profile.\",\"PeriodicalId\":269018,\"journal\":{\"name\":\"2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/radecs47380.2019.9745655\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/radecs47380.2019.9745655","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

本文提出了一种片上错误分类器，用于辐射下细胞的软错误率表征。它在触发器链上实现，在任务配置文件中计算单事件中断和单事件瞬态。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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CLASS: on-Chip Lightweight Accurate SEU/SET event claSSifier

This paper presents an on-chip error classifier for Soft-Error Rate characterization of cells under radiations. Implemented on top of flip-flop chains, it counts Single-Event Upset and Single-Event Transient at mission profile.

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来源期刊

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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