{"title":"多栅极mosfet的紧凑射频建模","authors":"B. Iñíguez, A. Lázaro, O. Moldovan","doi":"10.1109/EMICC.2006.282790","DOIUrl":null,"url":null,"abstract":"We present a compact modeling scheme for multiple-gate MOSFETs, based on a unified charge control model derived from the 1D Poisson's equation, which has been extended to the RF regime using the active transmission line approach. Compact expressions of the local small-signal parameters, including noise sources, are used in each segment. The resulting macro-models have been used to study the RF and noise performances of multiple-gate devices","PeriodicalId":269652,"journal":{"name":"2006 European Microwave Integrated Circuits Conference","volume":"58 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Compact RF Modeling of Multiple-Gate MOSFETs\",\"authors\":\"B. Iñíguez, A. Lázaro, O. Moldovan\",\"doi\":\"10.1109/EMICC.2006.282790\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present a compact modeling scheme for multiple-gate MOSFETs, based on a unified charge control model derived from the 1D Poisson's equation, which has been extended to the RF regime using the active transmission line approach. Compact expressions of the local small-signal parameters, including noise sources, are used in each segment. The resulting macro-models have been used to study the RF and noise performances of multiple-gate devices\",\"PeriodicalId\":269652,\"journal\":{\"name\":\"2006 European Microwave Integrated Circuits Conference\",\"volume\":\"58 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 European Microwave Integrated Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMICC.2006.282790\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 European Microwave Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMICC.2006.282790","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
We present a compact modeling scheme for multiple-gate MOSFETs, based on a unified charge control model derived from the 1D Poisson's equation, which has been extended to the RF regime using the active transmission line approach. Compact expressions of the local small-signal parameters, including noise sources, are used in each segment. The resulting macro-models have been used to study the RF and noise performances of multiple-gate devices