An enhanced analytical electrical masking model for multiple event transients

Due to the reducing transistor feature size, the susceptibility of modern circuits to radiation induced errors has increased. This, as a result, has increased the likelihood of multiple transients affecting a circuit. An important aspect when modeling convergent pulses is the approximation of the gate output. Thus, in this paper, a model that approximates the output pulse shape for convergent inputs is proposed. Extensive simulations showed that the proposed model matched closely with HSPICE and provides a speed-up of 15X.