Francisco Duarte, J. M. D. Silva, J. Alves, G. Pinho, J. S. Matos
{"title":"用于测试片上系统中混合信号核心的处理器","authors":"Francisco Duarte, J. M. D. Silva, J. Alves, G. Pinho, J. S. Matos","doi":"10.1109/DSD.2005.11","DOIUrl":null,"url":null,"abstract":"This paper describes the design of a processor specific for testing cores embedded in system-on-chip. This processor, which can be implemented within a system's reconfigurable area, shall be responsible for scheduling and control test operations and perform preliminary data processing, as well as to provide the interface with an external tester. Building these test operations on-chip allows for simplifying external tester interface and to reduce testing time. The testing procedure and the infrastructure required to test an A/D converter is described as an example.","PeriodicalId":119054,"journal":{"name":"8th Euromicro Conference on Digital System Design (DSD'05)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A processor for testing mixed-signal cores in system-on-chip\",\"authors\":\"Francisco Duarte, J. M. D. Silva, J. Alves, G. Pinho, J. S. Matos\",\"doi\":\"10.1109/DSD.2005.11\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the design of a processor specific for testing cores embedded in system-on-chip. This processor, which can be implemented within a system's reconfigurable area, shall be responsible for scheduling and control test operations and perform preliminary data processing, as well as to provide the interface with an external tester. Building these test operations on-chip allows for simplifying external tester interface and to reduce testing time. The testing procedure and the infrastructure required to test an A/D converter is described as an example.\",\"PeriodicalId\":119054,\"journal\":{\"name\":\"8th Euromicro Conference on Digital System Design (DSD'05)\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-08-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"8th Euromicro Conference on Digital System Design (DSD'05)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DSD.2005.11\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"8th Euromicro Conference on Digital System Design (DSD'05)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DSD.2005.11","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A processor for testing mixed-signal cores in system-on-chip
This paper describes the design of a processor specific for testing cores embedded in system-on-chip. This processor, which can be implemented within a system's reconfigurable area, shall be responsible for scheduling and control test operations and perform preliminary data processing, as well as to provide the interface with an external tester. Building these test operations on-chip allows for simplifying external tester interface and to reduce testing time. The testing procedure and the infrastructure required to test an A/D converter is described as an example.