具有浮岛和异质结二极管的高性能3.3KV 4H-SiC MOSFET

Jaeyeop Na, Kwan-Su Kim
{"title":"具有浮岛和异质结二极管的高性能3.3KV 4H-SiC MOSFET","authors":"Jaeyeop Na, Kwan-Su Kim","doi":"10.1109/ICEIC57457.2023.10049864","DOIUrl":null,"url":null,"abstract":"In this paper, a 3.3 kV 4H-SiC MOSFET structure with a floating island and a built-in heterojunction diode (FIHJD-MOSFET) is proposed, and analyzed by TCAD simulator. The floating island in the FIHJD-MOSFET not only improves the static performance of the device through charge balancing but also protects the P+ polysilicon region from a high electric field. Owing to this, the FIHJD-MOSFET operates stably even at high voltage, and the reverse recovery charge and the switching loss are also improved through the built-in heterojunction diode. As a result, B-FOM of FIHJD-MOSFET improved by 67.4 %, and reverse recovery charge and total switching loss were improved by 72.7 % and 66.4 % respectively, compared to conventional diffusion MOSFET (C-DMOSFET).","PeriodicalId":373752,"journal":{"name":"2023 International Conference on Electronics, Information, and Communication (ICEIC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-02-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High Performance 3.3KV 4H-SiC MOSFET with a Floating Island and Hetero Junction Diode\",\"authors\":\"Jaeyeop Na, Kwan-Su Kim\",\"doi\":\"10.1109/ICEIC57457.2023.10049864\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a 3.3 kV 4H-SiC MOSFET structure with a floating island and a built-in heterojunction diode (FIHJD-MOSFET) is proposed, and analyzed by TCAD simulator. The floating island in the FIHJD-MOSFET not only improves the static performance of the device through charge balancing but also protects the P+ polysilicon region from a high electric field. Owing to this, the FIHJD-MOSFET operates stably even at high voltage, and the reverse recovery charge and the switching loss are also improved through the built-in heterojunction diode. As a result, B-FOM of FIHJD-MOSFET improved by 67.4 %, and reverse recovery charge and total switching loss were improved by 72.7 % and 66.4 % respectively, compared to conventional diffusion MOSFET (C-DMOSFET).\",\"PeriodicalId\":373752,\"journal\":{\"name\":\"2023 International Conference on Electronics, Information, and Communication (ICEIC)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-02-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 International Conference on Electronics, Information, and Communication (ICEIC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICEIC57457.2023.10049864\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 International Conference on Electronics, Information, and Communication (ICEIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEIC57457.2023.10049864","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文提出了一种3.3 kV浮岛内置异质结二极管的4H-SiC MOSFET结构(FIHJD-MOSFET),并通过TCAD模拟器进行了分析。FIHJD-MOSFET中的浮岛不仅通过电荷平衡提高了器件的静态性能,而且还保护了P+多晶硅区域免受高电场的影响。因此,即使在高压下,FIHJD-MOSFET也可以稳定地工作,并且通过内置异质结二极管也可以提高反向恢复电荷和开关损耗。结果表明,与传统扩散MOSFET (C-DMOSFET)相比,FIHJD-MOSFET的B-FOM提高了67.4%,反向恢复电荷和总开关损耗分别提高了72.7%和66.4%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High Performance 3.3KV 4H-SiC MOSFET with a Floating Island and Hetero Junction Diode
In this paper, a 3.3 kV 4H-SiC MOSFET structure with a floating island and a built-in heterojunction diode (FIHJD-MOSFET) is proposed, and analyzed by TCAD simulator. The floating island in the FIHJD-MOSFET not only improves the static performance of the device through charge balancing but also protects the P+ polysilicon region from a high electric field. Owing to this, the FIHJD-MOSFET operates stably even at high voltage, and the reverse recovery charge and the switching loss are also improved through the built-in heterojunction diode. As a result, B-FOM of FIHJD-MOSFET improved by 67.4 %, and reverse recovery charge and total switching loss were improved by 72.7 % and 66.4 % respectively, compared to conventional diffusion MOSFET (C-DMOSFET).
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