K. Brown, I. Chiang, D. Gassner, J. Geller, J. Glenn, J. Hock, G.A. Smith, J. Tuozzolo, R. Witkover, E. Zitvogel
{"title":"AGS慢速提取光束的扫描目标剖面监视器","authors":"K. Brown, I. Chiang, D. Gassner, J. Geller, J. Glenn, J. Hock, G.A. Smith, J. Tuozzolo, R. Witkover, E. Zitvogel","doi":"10.1109/PAC.1997.751137","DOIUrl":null,"url":null,"abstract":"The purpose of this new instrument is for probing beam halo and obtaining beam profiles of the resonant extracted beam at the AGS. The device described is a prototype version, to obtain data and prepare for a more permanent device. The goals of the permanent device are to allow emittances of low current, but high intensity slowly extracted beams to be accurately measured and to have a diagnostic for probing the wings of the beam distribution. The device works on secondary emission from thin targets as well as scattering into two scintillator telescopes. The targets are movable over the entire aperture at the device.","PeriodicalId":122662,"journal":{"name":"Proceedings of the 1997 Particle Accelerator Conference (Cat. No.97CH36167)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-05-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A scanning target profile monitor for the slow extracted beam at the AGS\",\"authors\":\"K. Brown, I. Chiang, D. Gassner, J. Geller, J. Glenn, J. Hock, G.A. Smith, J. Tuozzolo, R. Witkover, E. Zitvogel\",\"doi\":\"10.1109/PAC.1997.751137\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The purpose of this new instrument is for probing beam halo and obtaining beam profiles of the resonant extracted beam at the AGS. The device described is a prototype version, to obtain data and prepare for a more permanent device. The goals of the permanent device are to allow emittances of low current, but high intensity slowly extracted beams to be accurately measured and to have a diagnostic for probing the wings of the beam distribution. The device works on secondary emission from thin targets as well as scattering into two scintillator telescopes. The targets are movable over the entire aperture at the device.\",\"PeriodicalId\":122662,\"journal\":{\"name\":\"Proceedings of the 1997 Particle Accelerator Conference (Cat. No.97CH36167)\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-05-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 1997 Particle Accelerator Conference (Cat. No.97CH36167)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PAC.1997.751137\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 1997 Particle Accelerator Conference (Cat. No.97CH36167)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PAC.1997.751137","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A scanning target profile monitor for the slow extracted beam at the AGS
The purpose of this new instrument is for probing beam halo and obtaining beam profiles of the resonant extracted beam at the AGS. The device described is a prototype version, to obtain data and prepare for a more permanent device. The goals of the permanent device are to allow emittances of low current, but high intensity slowly extracted beams to be accurately measured and to have a diagnostic for probing the wings of the beam distribution. The device works on secondary emission from thin targets as well as scattering into two scintillator telescopes. The targets are movable over the entire aperture at the device.