改变掺杂二氧化钒在自然条件下长时间贮存时的性质

Y. Kuznetsova, V. I. Surikov, V. I. Surikov, O. V. Lyah, N. Semenyuk
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引用次数: 1

摘要

本文比较了sv1−xFexO2和V1−xAlxO2固溶体样品在有序条件下长期贮存后的x射线衍射、电学和磁学研究结果以及热容量。反射现象的出现,据称属于V2O5和氧化铁(铝)相,是通过“储存”样品的x射线图确定的。发现材料的电学和磁性有显著的变化,而金属-半导体相变的热容量变化不太明显。用主动碰撞模型对结果进行了讨论。本文总结了导带的变形,以及由此导致的“存储”样品在费米能级附近的电子态密度的降低。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Changing the properties of doped vanadium dioxide during prolonged storage under natural conditions
The article compares the results of X-ray diffraction, electric and magnetic studies, as well as the heat capacity of samples of solid solutionsV1−xFexO2 and V1−xAlxO2 and the same samples after their long storage at ordinal conditions. The appearance of reflexes, allegedly belonging to the phases of V2O5 and iron oxide (aluminum), was fixed by the X-ray diagrams of “stored” samples. It was found a significant change in the electrical and magnetic properties of materials and less noticeable changes in the heat capacity of the metal-semiconductor phase transition. The results are discussed in the terms of the active collisions model. It is concluded about the deformation of the conduction band and, as a consequence, the reduction of the electronic states density near the Fermi level for the “stored” samples.
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