云纹调制深度及光斑尺寸的测量[CRT显示]

Cho-Liang Liang
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引用次数: 0

摘要

众所周知,云纹是可读性/焦点性能的对应物。如今,对CDT的可读性要求越来越高,迫使火炮设计人员将光束光斑做得越来越小。这使得云纹在一定的应用条件下不可避免,因为云纹图案的可见性是由电子束光斑决定的,而掩模孔径的结构决定了云纹波长。本文研究了扫描云纹的可见性与光斑尺寸之间的关系。利用CCD相机测量了云纹的调制深度(MD)和电子束光斑。通过改变水平动态像散和聚焦(DAF)电压,得到了云纹模量随光束光斑的变化规律。在亮度分布的5%和50%处,光斑大小都可以表征云纹MD,与理论计算相符。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Measurement on the modulation depth of moire and spot size [CRT display]
It is known that moire is the counterpart of readability/focus performance. Nowadays, the requirement on the readability of a CDT is getting higher and forces the gun designers to make the beam spot smaller and smaller. This makes moire inevitable under certain application conditions, because the visibility of the moire pattern is determined by the electron beam spot, while the structure of mask aperture determines moire wavelength. This paper is devoted to the study of the relationship between the visibility of scan moire and spot size from measurements. The modulation depth (MD) of moire and the electron beam spot are measured by a CCD camera. By varying the horizontal Dynamic Astigmatism and Focus (DAF) voltage, the variations of moire MD with beam spot are acquired. It is found that the spot size at both 5% and 50% of luminance distribution can characterize the moire MD in agreement with theoretical calculation.
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