锡银铜微细焊点互连界面的力学性能

Duanpeng He, Yan Xing, Xiang Yu, Hong Gao, Zhiyang Bai, Y. Li
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引用次数: 0

摘要

微型焊点在高端微电子产品中很常见。其承载能力和机械可靠性已成为影响产品性能的关键因素。通过纳米压痕试验,研究了低银无铅微接头焊接界面不同区域的力学性能。结果表明:界面IMC区硬度、模量和屈服强度均高于焊体区;界面IMC区也表现出较好的抗蠕变性能。研究结果为Sn1.0Ag0.5Cu低银无铅焊料的可靠性评价提供了依据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Mechanical properties of interconnection interfaces in micro tin-silver-copper solder joints
Micro solder joints are common in high-end microelectronics. Their load-bearing capacity and mechanical reliability have become the key factors affecting the performance of products. Herein, the mechanical properties of different regions in the welding interface of low-silver lead-free micro joints were explored by nanoindentation tests. The results showed that the hardness, modulus and yield strength of interfacial IMC regions were higher than those of solder body region. The interfacial IMC regions also displayed better creep resistance than the body region. The research results lent support for the reliability evaluation of Sn1.0Ag0.5Cu low-silver lead-free solders.
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