预测电子封装热机械可靠性的建模方法

M. Thurston, G. Raiser, D. Chiang, S. Tandon, M. Mello
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引用次数: 0

摘要

描述了一种预测电子封装的热机械可靠性的方法,作为封装设计,材料和组装过程变量和环境条件的函数。该方法集成了有限元应力和强度分析、实验材料本构和强度特性测量、实验包应力和强度验证、实验统计设计(DOE)和蒙特卡罗分析技术。广泛的实验和数值评估结果证明了构成该方法的实验和建模技术的稳定性和能力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Modeling methodology for predicting the thermo-mechanical reliability of electronic packaging
A methodology for predicting the thermo-mechanical reliability of electronic packaging as a function of package design, material, and assembly process variables and environmental conditions is described. The methodology integrates finite element stress and strength analysis, experimental material constitutive and strength property measurement, experimental package stress and strength validation, and statistical design of experiment (DOE) and Monte Carlo analysis techniques. The results of extensive experimental and numerical evaluations demonstrating the stability and capability of the experimental and modeling techniques constituting the methodology are presented.
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