OD3P:按需页面配对PCM

Marjan Asadinia, M. Arjomand, H. Sarbazi-Azad
{"title":"OD3P:按需页面配对PCM","authors":"Marjan Asadinia, M. Arjomand, H. Sarbazi-Azad","doi":"10.1145/2593069.2593166","DOIUrl":null,"url":null,"abstract":"With current memory scalability challenges, Phase Change Memory (PCM) is viewed as an attractive replacement to DRAM. The preliminary concern for PCM applicability is its limited write endurance that is highly affected by process variation in nanometer regime. This increases the variation in cell lifetime resulting in early and sudden reduction in main memory capacity due to wear-out of few cells. When some memory pages reach their endurance limits, other pages may be far from their limits even when using a perfect wear-leveling. Recent studies have proposed redirection or correction schemes to alleviate this problem, but all suffer from poor throughput or latency. On contrary, we present On-Demand Page Paired PCM (OD3P), a technique that mitigates the problem of fast failure of pages by redirecting them onto other healthy pages, leading to gradual capacity degradation. Compared to a state-of-the-art error correction scheme for PCM, our experiments indicated that OD3P can improve PCM time-to-failure and system performance (IPC) by 12% and 14%, respectively, under multi-threaded and multi-programmed workloads.","PeriodicalId":433816,"journal":{"name":"2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"OD3P: On-Demand Page Paired PCM\",\"authors\":\"Marjan Asadinia, M. Arjomand, H. Sarbazi-Azad\",\"doi\":\"10.1145/2593069.2593166\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"With current memory scalability challenges, Phase Change Memory (PCM) is viewed as an attractive replacement to DRAM. The preliminary concern for PCM applicability is its limited write endurance that is highly affected by process variation in nanometer regime. This increases the variation in cell lifetime resulting in early and sudden reduction in main memory capacity due to wear-out of few cells. When some memory pages reach their endurance limits, other pages may be far from their limits even when using a perfect wear-leveling. Recent studies have proposed redirection or correction schemes to alleviate this problem, but all suffer from poor throughput or latency. On contrary, we present On-Demand Page Paired PCM (OD3P), a technique that mitigates the problem of fast failure of pages by redirecting them onto other healthy pages, leading to gradual capacity degradation. Compared to a state-of-the-art error correction scheme for PCM, our experiments indicated that OD3P can improve PCM time-to-failure and system performance (IPC) by 12% and 14%, respectively, under multi-threaded and multi-programmed workloads.\",\"PeriodicalId\":433816,\"journal\":{\"name\":\"2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/2593069.2593166\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2593069.2593166","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

摘要

面对当前存储器可扩展性的挑战,相变存储器(PCM)被视为DRAM的一个有吸引力的替代品。对PCM适用性的初步关注是其有限的写入持久性,这在纳米范围内受到工艺变化的高度影响。这增加了细胞寿命的变化,导致由于少数细胞的磨损而导致主存储器容量的早期和突然减少。当一些内存页达到其持久极限时,即使使用完美的损耗均衡,其他页面也可能远未达到其极限。最近的研究提出了重定向或纠正方案来缓解这个问题,但都存在吞吐量差或延迟的问题。相反,我们提出了按需页面配对PCM (OD3P),这是一种通过将页面重定向到其他健康页面来减轻页面快速故障问题的技术,从而导致容量逐渐降低。与最先进的PCM纠错方案相比,我们的实验表明,在多线程和多编程工作负载下,OD3P可以将PCM的故障处理时间和系统性能(IPC)分别提高12%和14%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
OD3P: On-Demand Page Paired PCM
With current memory scalability challenges, Phase Change Memory (PCM) is viewed as an attractive replacement to DRAM. The preliminary concern for PCM applicability is its limited write endurance that is highly affected by process variation in nanometer regime. This increases the variation in cell lifetime resulting in early and sudden reduction in main memory capacity due to wear-out of few cells. When some memory pages reach their endurance limits, other pages may be far from their limits even when using a perfect wear-leveling. Recent studies have proposed redirection or correction schemes to alleviate this problem, but all suffer from poor throughput or latency. On contrary, we present On-Demand Page Paired PCM (OD3P), a technique that mitigates the problem of fast failure of pages by redirecting them onto other healthy pages, leading to gradual capacity degradation. Compared to a state-of-the-art error correction scheme for PCM, our experiments indicated that OD3P can improve PCM time-to-failure and system performance (IPC) by 12% and 14%, respectively, under multi-threaded and multi-programmed workloads.
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