{"title":"双端口噪声参数测量的新方法","authors":"D. Pasquet, C. Andrei, D. Lesenechal, P. Descamps","doi":"10.1109/MSMW.2010.5545989","DOIUrl":null,"url":null,"abstract":"The noise parameters are useful for the design of low noise amplifiers. They are usually deducted by the measurement of the noise figure that varies with the impedance presented at the input as in Eq. 1. F= F<inf>MIN</inf> + R<inf>N</inf> over ∜ Y<inf>S</inf>|Y<inf>S</inf> − Y<inf>OPT</inf>|<sup>2</sup> (1) where Y<inf>S</inf> is the admittance presented at the input and Y<inf>OPT</inf> is the admittance for which the noise figure has its lower value F<inf>MIN</inf>. R<inf>N</inf> is the noise resistance that characterizes the sensitivity to the variation of the impedance. Many optimization methods [1] have been developed in order to reach F<inf>MIN</inf>, R<inf>N</inf> and Y<inf>OPT</inf> from many measurement points.","PeriodicalId":129834,"journal":{"name":"2010 INTERNATIONAL KHARKOV SYMPOSIUM ON PHYSICS AND ENGINEERING OF MICROWAVES, MILLIMETER AND SUBMILLIMETER WAVES","volume":"216 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"New measurement method for two-port noise parameters\",\"authors\":\"D. Pasquet, C. Andrei, D. Lesenechal, P. Descamps\",\"doi\":\"10.1109/MSMW.2010.5545989\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The noise parameters are useful for the design of low noise amplifiers. They are usually deducted by the measurement of the noise figure that varies with the impedance presented at the input as in Eq. 1. F= F<inf>MIN</inf> + R<inf>N</inf> over ∜ Y<inf>S</inf>|Y<inf>S</inf> − Y<inf>OPT</inf>|<sup>2</sup> (1) where Y<inf>S</inf> is the admittance presented at the input and Y<inf>OPT</inf> is the admittance for which the noise figure has its lower value F<inf>MIN</inf>. R<inf>N</inf> is the noise resistance that characterizes the sensitivity to the variation of the impedance. Many optimization methods [1] have been developed in order to reach F<inf>MIN</inf>, R<inf>N</inf> and Y<inf>OPT</inf> from many measurement points.\",\"PeriodicalId\":129834,\"journal\":{\"name\":\"2010 INTERNATIONAL KHARKOV SYMPOSIUM ON PHYSICS AND ENGINEERING OF MICROWAVES, MILLIMETER AND SUBMILLIMETER WAVES\",\"volume\":\"216 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-06-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 INTERNATIONAL KHARKOV SYMPOSIUM ON PHYSICS AND ENGINEERING OF MICROWAVES, MILLIMETER AND SUBMILLIMETER WAVES\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MSMW.2010.5545989\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 INTERNATIONAL KHARKOV SYMPOSIUM ON PHYSICS AND ENGINEERING OF MICROWAVES, MILLIMETER AND SUBMILLIMETER WAVES","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MSMW.2010.5545989","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
New measurement method for two-port noise parameters
The noise parameters are useful for the design of low noise amplifiers. They are usually deducted by the measurement of the noise figure that varies with the impedance presented at the input as in Eq. 1. F= FMIN + RN over ∜ YS|YS − YOPT|2 (1) where YS is the admittance presented at the input and YOPT is the admittance for which the noise figure has its lower value FMIN. RN is the noise resistance that characterizes the sensitivity to the variation of the impedance. Many optimization methods [1] have been developed in order to reach FMIN, RN and YOPT from many measurement points.
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