{"title":"同轴马赫曾德干涉仪低噪声测量中的功率回收方法","authors":"Stephen Parker, Eugene Ivanov, Michael E. Tobar","doi":"10.1109/FREQ.2008.4623113","DOIUrl":null,"url":null,"abstract":"We present the first experimental study of a new type of power recycling microwave interferometer designed for low noise measurements. This system enhances sensitivity to phase fluctuations in a device under test, independent of input power levels. The single sideband thermal white phase noise floor of the system has been lowered by 8 dB (reaching 185 dBc/Hz at 1 kHz offset frequency) at relatively low power levels (13 dBm).","PeriodicalId":220442,"journal":{"name":"2008 IEEE International Frequency Control Symposium","volume":"98 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Method of power recycling in co-axial mach zender interferometers for low noise measurements\",\"authors\":\"Stephen Parker, Eugene Ivanov, Michael E. Tobar\",\"doi\":\"10.1109/FREQ.2008.4623113\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present the first experimental study of a new type of power recycling microwave interferometer designed for low noise measurements. This system enhances sensitivity to phase fluctuations in a device under test, independent of input power levels. The single sideband thermal white phase noise floor of the system has been lowered by 8 dB (reaching 185 dBc/Hz at 1 kHz offset frequency) at relatively low power levels (13 dBm).\",\"PeriodicalId\":220442,\"journal\":{\"name\":\"2008 IEEE International Frequency Control Symposium\",\"volume\":\"98 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-05-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 IEEE International Frequency Control Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FREQ.2008.4623113\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE International Frequency Control Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FREQ.2008.4623113","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Method of power recycling in co-axial mach zender interferometers for low noise measurements
We present the first experimental study of a new type of power recycling microwave interferometer designed for low noise measurements. This system enhances sensitivity to phase fluctuations in a device under test, independent of input power levels. The single sideband thermal white phase noise floor of the system has been lowered by 8 dB (reaching 185 dBc/Hz at 1 kHz offset frequency) at relatively low power levels (13 dBm).