Characterization and evaluation of thin films of a polymer reinforced with nanoparticles using the spin coating technique

Thin films of the polymer, polyvinylpyloridate, reinforced with zinc-nickel ferrite nanoparticles (Zn0.5Ni0.5Fe2O4) and prepared using the technique of spin coating is the central theme of presentation and discussion in this research paper. The zinc-nickel ferrite nanoparticles were used to reinforce a thin film of the chosen polymer and for varying concentrations. The prepared thin films were transparent and consequently studied for the purpose of selection and use in applications specific to the domain of photonics. Optical characterization of samples of the as-synthesized thin films was done using different spectroscopy techniques. Optical density of the as-prepared thin films was obtained using a ultra-violet (UV) spectrophotometer. The reinforcing effect was observed from the emission spectra that was obtained using the fluorescence spectrophotometer. Also, Fourier transform infrared spectroscopy (FTIR) of the reinforced thin films of the chosen polymer was obtained and compared with the unreinforced pure polymer and did reveal an observable change in both the peak value and intensity of the peak. X-ray diffraction (XRD) analysis revealed a noticeable difference in both intensity and crystallization of the thin films of the reinforced polymer. Scanning electron microscopy observations revealed a morphological change of the thin films. Roughness of the sample surface was studied with the help of images obtained from an atomic force microscope (AFM). The present research study technique of spin coating was done properly and successfully. With a gradual increase in the number of reinforcing nanoparticles in the polymer matrix we did observe an increase in Optical Density using UV-Visible spectroscopy. An increase in the Optical Density is beneficial for attaining an improvement in anti-reflection response. This study helped establish the effect of nanoparticle reinforcements on optical properties while concurrently establishing the need for selection and use of thin films for applications in the field of photonics.