耦合微带线中远端串扰及远端串扰饱和的模态分析与建模

Gawon Kim, Eakhwan Song, Jiseong Kim, Joungho Kim
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引用次数: 2

摘要

本文提出了模态分析方法,并对ext波形进行了精确建模。利用该方法,根据输入阶跃脉冲的奇偶模速度差与初始上升时间之间的关系,可以解释频域饱和现象,并提出精确的频域方程。通过对两条耦合微带型传输线的串扰仿真,验证了随持续时间增加的饱和文本电平。模态分析方法得到的FEXT和TDT波形与实测波形具有良好的相关性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Precise analysis and modeling of far-end crosstalk and far-end crosstalk saturation using mode analysis in coupled microstrip lines
In this paper, the mode analysis method has been proposed and model the precise FEXT waveform. Using this method, FEXT saturation phenomenon can be explained and the precise FEXT equations are proposed depending on the relationship between the velocity difference of even- and odd-mode and the initial rising time of the input step pulse. Saturated FEXT level with increased duration were verified by the crosstalk simulation in two coupled microstrip-type transmission lines. The modeled FEXT and TDT waveforms by the mode analysis method show a good correlation with the measured waveforms.
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