{"title":"耦合微带线中远端串扰及远端串扰饱和的模态分析与建模","authors":"Gawon Kim, Eakhwan Song, Jiseong Kim, Joungho Kim","doi":"10.1109/EDAPS.2009.5404010","DOIUrl":null,"url":null,"abstract":"In this paper, the mode analysis method has been proposed and model the precise FEXT waveform. Using this method, FEXT saturation phenomenon can be explained and the precise FEXT equations are proposed depending on the relationship between the velocity difference of even- and odd-mode and the initial rising time of the input step pulse. Saturated FEXT level with increased duration were verified by the crosstalk simulation in two coupled microstrip-type transmission lines. The modeled FEXT and TDT waveforms by the mode analysis method show a good correlation with the measured waveforms.","PeriodicalId":370741,"journal":{"name":"2009 IEEE Electrical Design of Advanced Packaging & Systems Symposium (EDAPS)","volume":"105 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Precise analysis and modeling of far-end crosstalk and far-end crosstalk saturation using mode analysis in coupled microstrip lines\",\"authors\":\"Gawon Kim, Eakhwan Song, Jiseong Kim, Joungho Kim\",\"doi\":\"10.1109/EDAPS.2009.5404010\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, the mode analysis method has been proposed and model the precise FEXT waveform. Using this method, FEXT saturation phenomenon can be explained and the precise FEXT equations are proposed depending on the relationship between the velocity difference of even- and odd-mode and the initial rising time of the input step pulse. Saturated FEXT level with increased duration were verified by the crosstalk simulation in two coupled microstrip-type transmission lines. The modeled FEXT and TDT waveforms by the mode analysis method show a good correlation with the measured waveforms.\",\"PeriodicalId\":370741,\"journal\":{\"name\":\"2009 IEEE Electrical Design of Advanced Packaging & Systems Symposium (EDAPS)\",\"volume\":\"105 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 IEEE Electrical Design of Advanced Packaging & Systems Symposium (EDAPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDAPS.2009.5404010\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE Electrical Design of Advanced Packaging & Systems Symposium (EDAPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDAPS.2009.5404010","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Precise analysis and modeling of far-end crosstalk and far-end crosstalk saturation using mode analysis in coupled microstrip lines
In this paper, the mode analysis method has been proposed and model the precise FEXT waveform. Using this method, FEXT saturation phenomenon can be explained and the precise FEXT equations are proposed depending on the relationship between the velocity difference of even- and odd-mode and the initial rising time of the input step pulse. Saturated FEXT level with increased duration were verified by the crosstalk simulation in two coupled microstrip-type transmission lines. The modeled FEXT and TDT waveforms by the mode analysis method show a good correlation with the measured waveforms.