A new-type THz null-ellipsometer based on quasi-optical transmission line and components

Ellipsometry is a set of noncontact and nondestructive experimental techniques for studying physical properties and structural parameters of various materials and systems [1-3]. Ellipsometry is based on the phenomena of radiation polarization state change at reflecting from a surface. At present, extension of the probing radiation frequency-range is one of the major development lines of ellipsometric experimental technique. Each spectral interval requires specific elements and design though general configuration remains the same.