MMIC功率放大器的内部波形探测

ICMMT 2000. 2000 2nd International Conference on Microwave and Millimeter Wave Technology Proceedings (Cat. No.00EX364) Pub Date : 2000-09-14 DOI:10.1109/ICMMT.2000.895768

J.C.M. Hwang

{"title":"MMIC功率放大器的内部波形探测","authors":"J.C.M. Hwang","doi":"10.1109/ICMMT.2000.895768","DOIUrl":null,"url":null,"abstract":"A microwave waveform internal probing technique for MMICs under normal CW or pulsed operation is described. The application to HBT and HEMT power amplifiers are demonstrated. The present high-impedance probing approach is compared to optical probing techniques.","PeriodicalId":354225,"journal":{"name":"ICMMT 2000. 2000 2nd International Conference on Microwave and Millimeter Wave Technology Proceedings (Cat. No.00EX364)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Internal waveform probing of MMIC power amplifiers\",\"authors\":\"J.C.M. Hwang\",\"doi\":\"10.1109/ICMMT.2000.895768\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A microwave waveform internal probing technique for MMICs under normal CW or pulsed operation is described. The application to HBT and HEMT power amplifiers are demonstrated. The present high-impedance probing approach is compared to optical probing techniques.\",\"PeriodicalId\":354225,\"journal\":{\"name\":\"ICMMT 2000. 2000 2nd International Conference on Microwave and Millimeter Wave Technology Proceedings (Cat. No.00EX364)\",\"volume\":\"25 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-09-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICMMT 2000. 2000 2nd International Conference on Microwave and Millimeter Wave Technology Proceedings (Cat. No.00EX364)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMMT.2000.895768\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICMMT 2000. 2000 2nd International Conference on Microwave and Millimeter Wave Technology Proceedings (Cat. No.00EX364)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMMT.2000.895768","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 2

摘要

介绍了一种用于常规连续波或脉冲工作的微波集成电路的微波波形内探测技术。演示了该方法在HBT和HEMT功率放大器中的应用。将现有的高阻抗探测方法与光学探测技术进行了比较。

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Internal waveform probing of MMIC power amplifiers

A microwave waveform internal probing technique for MMICs under normal CW or pulsed operation is described. The application to HBT and HEMT power amplifiers are demonstrated. The present high-impedance probing approach is compared to optical probing techniques.

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来源期刊

ICMMT 2000. 2000 2nd International Conference on Microwave and Millimeter Wave Technology Proceedings (Cat. No.00EX364)

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