{"title":"绝缘栅双极晶体管的锁存预防","authors":"A. Nezar, P. Mok, C. Salama","doi":"10.1109/ISPSD.1993.297074","DOIUrl":null,"url":null,"abstract":"A technique for improving the latch-up capability of the LIGBT (lateral insulated-gate bipolar transistor) is proposed. A shallow trench at the cathode is used to reduce the p-base resistance and eliminate the p-well resistance, and consequently prevent the device from latching-up at low voltages. The latch-up current for the trenched LIGBT is higher than that of a conventional LIGBT. The holding voltage exceeds the saturation voltage by far and allows the device to operate at high static power.<<ETX>>","PeriodicalId":223632,"journal":{"name":"[1993] Proceedings of the 5th International Symposium on Power Semiconductor Devices and ICs","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Latch-up prevention in insulated gate bipolar transistors\",\"authors\":\"A. Nezar, P. Mok, C. Salama\",\"doi\":\"10.1109/ISPSD.1993.297074\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A technique for improving the latch-up capability of the LIGBT (lateral insulated-gate bipolar transistor) is proposed. A shallow trench at the cathode is used to reduce the p-base resistance and eliminate the p-well resistance, and consequently prevent the device from latching-up at low voltages. The latch-up current for the trenched LIGBT is higher than that of a conventional LIGBT. The holding voltage exceeds the saturation voltage by far and allows the device to operate at high static power.<<ETX>>\",\"PeriodicalId\":223632,\"journal\":{\"name\":\"[1993] Proceedings of the 5th International Symposium on Power Semiconductor Devices and ICs\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-05-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1993] Proceedings of the 5th International Symposium on Power Semiconductor Devices and ICs\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD.1993.297074\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1993] Proceedings of the 5th International Symposium on Power Semiconductor Devices and ICs","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1993.297074","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Latch-up prevention in insulated gate bipolar transistors
A technique for improving the latch-up capability of the LIGBT (lateral insulated-gate bipolar transistor) is proposed. A shallow trench at the cathode is used to reduce the p-base resistance and eliminate the p-well resistance, and consequently prevent the device from latching-up at low voltages. The latch-up current for the trenched LIGBT is higher than that of a conventional LIGBT. The holding voltage exceeds the saturation voltage by far and allows the device to operate at high static power.<>