区域/功率高效的电极匹配神经尖峰检测器嵌入可植入的256通道MEA

Myungjin Han, G. Ha, Eunji Cheong, G. Han, Youngcheol Chae
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引用次数: 2

摘要

提出了一种紧凑的面积/功率高效的电极匹配神经尖峰检测器(NSD),以提供可植入的多电极阵列(MEA)。仅使用输入采样电容的相关方案可以减小面积,并且记录神经尖峰事件可以减小功率,显示为0.0044 mm2和0.55 μW。与所提出的NSD一起,制作了一个可植入的256通道MEA。电学测量结果表明,在1 kHz ~ 10 kHz带宽范围内,NSD的输入参考噪声为10.1 μVrms, NEF/PEF/AEF分别为1.71/5.28/0.0044,CMRR为67.5 dB。与以前最先进的nsd相比,它显示了×7.5/×1.6面积/功率改进。通过细胞培养和脑切片实验验证了所制备的可植入MEA。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An area/power efficient electrode-matched neural-spike detector embedded in implantable 256-channel MEA
A compact area/power efficient electrode-matched neural-spike detector (NSD) is proposed to provide an implantable multi-electrode array (MEA). A correlation scheme with only the input sampling capacitors makes an area reduction, and the recording of neural-spike events enables a power reduction, showing 0.0044 mm2 and 0.55 μW. Together with proposed NSD, an implantable 256-channel MEA is fabricated. The electrical measurement results show that the NSD achieves an input-referred noise of 10.1 μVrms with 1 kHz to 10 kHz bandwidth, providing NEF/PEF/AEF of 1.71/5.28/0.0044, respectively, and CMRR of 67.5 dB. It shows ×7.5/×1.6 area/power improvements, compared to previous state-of-the-art NSDs. The fabricated implantable MEA is demonstrated by cell-cultured and brain-sliced experiments.
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