一种新颖的晶圆级技术,用于解决与欠填FCOB相关的工艺和成本障碍

R. V. Burress, M. Capote, Yong-Joon Lee, H.A. Lenos, J.F. Zamora
{"title":"一种新颖的晶圆级技术,用于解决与欠填FCOB相关的工艺和成本障碍","authors":"R. V. Burress, M. Capote, Yong-Joon Lee, H.A. Lenos, J.F. Zamora","doi":"10.1109/ECTC.2002.1008125","DOIUrl":null,"url":null,"abstract":"This paper provides an update on development work underway to produce a novel wafer-scale packaging technology. The technology, referred to as multi-layer, wafer-scale encapsulation (MLWSE), relies on high performance polymers which are used in wafer-level encapsulation and subsequent electronic assembly processes. High-speed laser processing, which is used to produce the interconnection structure, is another integral aspect of this technology. We will describe the basic elements of the technology and present the current state of development with data from test assemblies. Also to be discussed are the potential technological/assembly benefits offered by the MLWSE technology and a summary of the results of a cost analysis comparing this technology to other HDI technologies.","PeriodicalId":285713,"journal":{"name":"52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A novel, wafer-scale technology for addressing process and cost obstacles associated with underfilling FCOB\",\"authors\":\"R. V. Burress, M. Capote, Yong-Joon Lee, H.A. Lenos, J.F. Zamora\",\"doi\":\"10.1109/ECTC.2002.1008125\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper provides an update on development work underway to produce a novel wafer-scale packaging technology. The technology, referred to as multi-layer, wafer-scale encapsulation (MLWSE), relies on high performance polymers which are used in wafer-level encapsulation and subsequent electronic assembly processes. High-speed laser processing, which is used to produce the interconnection structure, is another integral aspect of this technology. We will describe the basic elements of the technology and present the current state of development with data from test assemblies. Also to be discussed are the potential technological/assembly benefits offered by the MLWSE technology and a summary of the results of a cost analysis comparing this technology to other HDI technologies.\",\"PeriodicalId\":285713,\"journal\":{\"name\":\"52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.2002.1008125\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2002.1008125","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

本文提供了开发工作的最新进展,以生产一种新的晶圆级封装技术。该技术被称为多层晶圆级封装(MLWSE),它依赖于用于晶圆级封装和随后的电子组装过程的高性能聚合物。用于生产互连结构的高速激光加工是该技术的另一个组成部分。我们将描述该技术的基本元素,并使用测试组件的数据展示当前的开发状态。还将讨论MLWSE技术提供的潜在技术/装配优势,以及将该技术与其他HDI技术进行成本分析的结果总结。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A novel, wafer-scale technology for addressing process and cost obstacles associated with underfilling FCOB
This paper provides an update on development work underway to produce a novel wafer-scale packaging technology. The technology, referred to as multi-layer, wafer-scale encapsulation (MLWSE), relies on high performance polymers which are used in wafer-level encapsulation and subsequent electronic assembly processes. High-speed laser processing, which is used to produce the interconnection structure, is another integral aspect of this technology. We will describe the basic elements of the technology and present the current state of development with data from test assemblies. Also to be discussed are the potential technological/assembly benefits offered by the MLWSE technology and a summary of the results of a cost analysis comparing this technology to other HDI technologies.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信