{"title":"从回波损耗共振估计毫米波电路插入损耗","authors":"A. Theiss","doi":"10.1109/IVELEC.2007.4283370","DOIUrl":null,"url":null,"abstract":"Measurements of RF loss in millimeter- wave circuits typically are limited to frequencies that are impedance matched to permit transmission through the circuit. An alternate cold-test method can provide estimates of such RF absorption for frequencies that are not matched by measuring return- loss resonances without regard for coupling conditions.","PeriodicalId":254940,"journal":{"name":"2007 IEEE International Vacuum Electronics Conference","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Estimating Millimeter-Wave-Circuit Insertion Loss from Return-Loss Resonances\",\"authors\":\"A. Theiss\",\"doi\":\"10.1109/IVELEC.2007.4283370\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Measurements of RF loss in millimeter- wave circuits typically are limited to frequencies that are impedance matched to permit transmission through the circuit. An alternate cold-test method can provide estimates of such RF absorption for frequencies that are not matched by measuring return- loss resonances without regard for coupling conditions.\",\"PeriodicalId\":254940,\"journal\":{\"name\":\"2007 IEEE International Vacuum Electronics Conference\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-05-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE International Vacuum Electronics Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVELEC.2007.4283370\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Vacuum Electronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVELEC.2007.4283370","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Estimating Millimeter-Wave-Circuit Insertion Loss from Return-Loss Resonances
Measurements of RF loss in millimeter- wave circuits typically are limited to frequencies that are impedance matched to permit transmission through the circuit. An alternate cold-test method can provide estimates of such RF absorption for frequencies that are not matched by measuring return- loss resonances without regard for coupling conditions.
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