J. Mane, F. Normand, R. Medjo, Costel Sorin Cojocaru, O. Ersen, A. Senger, C. Laffon, B. T. Sendja, C. M. Biouele, G. Ben-Bolie, P. Ateba, P. Parent
{"title":"垂直生长的碳纳米结构取向:x射线吸收光谱研究","authors":"J. Mane, F. Normand, R. Medjo, Costel Sorin Cojocaru, O. Ersen, A. Senger, C. Laffon, B. T. Sendja, C. M. Biouele, G. Ben-Bolie, P. Ateba, P. Parent","doi":"10.9734/bpi/nicst/v13/7246d","DOIUrl":null,"url":null,"abstract":"X-Ray Absorption Spectroscopy (XAS) on the carbon K edge of carbon nanostructures (nanotubes, nanofibers, nanowalls) is reported here. They are grown on plain SiO2 (8 nm thick) /Si (100) sub - strates by a Plasma and Hot Filaments - enhanced Catalytic Chemical Vapor Deposition (PE HF CCVD) process. The XAS spectra are highly sensitive to a previous thermal treatment, as an intense adsorption on the outer wall of the nanotubes may strongly affect the absorption transitions. The morphology and the nature of these carbon nanostructures are characterized by SEM, TEM and Raman spectroscopy. According to conditions of catalyst preparation and DC HF CCVD process, carbon nanotubes (CNTs), carbon nanofibers (CNFs), carbon nanowalls (CNWs), carbon nanoparticles (CNPs) with different orientation of the graphene plans or shells can be prepared. From the angular dependence of the incident light and geometrical morphology of the nanostructures, wide variations of the C K - edge intensity of the transitions to the empty \\(\\pi\\)* and \\(\\sigma\\)* states occur. A full lineshape analysis of the XAS spectra has been carried out using a home -made soft - ware, allowing estimating the relative proportion of \\(\\pi\\)* and \\(\\sigma\\)* transitions. A geometrical model of the angular dependence with the incidence angle of the light and the morphology of the carbon nanostructures is derived. With normalization to the HOPG (Highly Oriented Pyrolytic Graphite) reference case, a degree of alignment can be extracted which is representative of the localized orientation of the graphitic carbon \\(\\pi\\) bonds, accounting not only for the overall orientation, but also for local defects like impurities incorporation, structural defects,… This degree of alignment shows good agreement with SEM observations. Thus CNTs films display degrees of alignment around 50%, depending on the occurrence of defects in the course of the growth, whereas no special alignment can be detected with CNFs and CNPs, and a weak one (about 20%) is detected on CNWs.","PeriodicalId":420814,"journal":{"name":"New Ideas Concerning Science and Technology Vol. 13","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Vertically Grown Carbon Nanostructure Alignment: An Investigation by Using X-Ray Absorption Spectroscopy\",\"authors\":\"J. Mane, F. Normand, R. Medjo, Costel Sorin Cojocaru, O. Ersen, A. Senger, C. Laffon, B. T. Sendja, C. M. Biouele, G. Ben-Bolie, P. Ateba, P. Parent\",\"doi\":\"10.9734/bpi/nicst/v13/7246d\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"X-Ray Absorption Spectroscopy (XAS) on the carbon K edge of carbon nanostructures (nanotubes, nanofibers, nanowalls) is reported here. They are grown on plain SiO2 (8 nm thick) /Si (100) sub - strates by a Plasma and Hot Filaments - enhanced Catalytic Chemical Vapor Deposition (PE HF CCVD) process. The XAS spectra are highly sensitive to a previous thermal treatment, as an intense adsorption on the outer wall of the nanotubes may strongly affect the absorption transitions. The morphology and the nature of these carbon nanostructures are characterized by SEM, TEM and Raman spectroscopy. According to conditions of catalyst preparation and DC HF CCVD process, carbon nanotubes (CNTs), carbon nanofibers (CNFs), carbon nanowalls (CNWs), carbon nanoparticles (CNPs) with different orientation of the graphene plans or shells can be prepared. From the angular dependence of the incident light and geometrical morphology of the nanostructures, wide variations of the C K - edge intensity of the transitions to the empty \\\\(\\\\pi\\\\)* and \\\\(\\\\sigma\\\\)* states occur. A full lineshape analysis of the XAS spectra has been carried out using a home -made soft - ware, allowing estimating the relative proportion of \\\\(\\\\pi\\\\)* and \\\\(\\\\sigma\\\\)* transitions. A geometrical model of the angular dependence with the incidence angle of the light and the morphology of the carbon nanostructures is derived. With normalization to the HOPG (Highly Oriented Pyrolytic Graphite) reference case, a degree of alignment can be extracted which is representative of the localized orientation of the graphitic carbon \\\\(\\\\pi\\\\) bonds, accounting not only for the overall orientation, but also for local defects like impurities incorporation, structural defects,… This degree of alignment shows good agreement with SEM observations. Thus CNTs films display degrees of alignment around 50%, depending on the occurrence of defects in the course of the growth, whereas no special alignment can be detected with CNFs and CNPs, and a weak one (about 20%) is detected on CNWs.\",\"PeriodicalId\":420814,\"journal\":{\"name\":\"New Ideas Concerning Science and Technology Vol. 13\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-06-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"New Ideas Concerning Science and Technology Vol. 13\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.9734/bpi/nicst/v13/7246d\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"New Ideas Concerning Science and Technology Vol. 13","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.9734/bpi/nicst/v13/7246d","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
本文报道了碳纳米结构(纳米管、纳米纤维、纳米墙)碳K边的x射线吸收光谱(XAS)。它们是通过等离子体和热丝增强催化化学气相沉积(PE HF CCVD)工艺在普通SiO2 (8 nm厚)/Si(100)基板上生长的。XAS光谱对先前的热处理高度敏感,因为纳米管外壁上的强烈吸附可能强烈影响吸收转变。利用SEM、TEM和拉曼光谱对碳纳米结构的形貌和性质进行了表征。根据催化剂制备条件和直流HF CCVD工艺,可以制备出具有不同取向石墨烯平面或壳层的碳纳米管(CNTs)、碳纳米纤维(CNFs)、碳纳米墙(CNWs)和碳纳米颗粒(CNPs)。从入射光的角度依赖性和纳米结构的几何形态来看,向空\(\pi\) *和\(\sigma\) *态过渡的C - K边缘强度发生了很大的变化。使用自制的软件对XAS光谱进行了全线形分析,可以估计\(\pi\) *和\(\sigma\) *跃迁的相对比例。推导了光入射角度与碳纳米结构形貌的几何关系模型。通过对HOPG(高取向热解石墨)参考案例的归一化,可以提取出一个取向度,它代表了石墨碳\(\pi\)键的局部取向,不仅考虑了整体取向,还考虑了杂质掺杂、结构缺陷等局部缺陷,这种取向度与SEM观察结果吻合良好。因此,碳纳米管薄膜的排列度约为50%, depending on the occurrence of defects in the course of the growth, whereas no special alignment can be detected with CNFs and CNPs, and a weak one (about 20%) is detected on CNWs.
Vertically Grown Carbon Nanostructure Alignment: An Investigation by Using X-Ray Absorption Spectroscopy
X-Ray Absorption Spectroscopy (XAS) on the carbon K edge of carbon nanostructures (nanotubes, nanofibers, nanowalls) is reported here. They are grown on plain SiO2 (8 nm thick) /Si (100) sub - strates by a Plasma and Hot Filaments - enhanced Catalytic Chemical Vapor Deposition (PE HF CCVD) process. The XAS spectra are highly sensitive to a previous thermal treatment, as an intense adsorption on the outer wall of the nanotubes may strongly affect the absorption transitions. The morphology and the nature of these carbon nanostructures are characterized by SEM, TEM and Raman spectroscopy. According to conditions of catalyst preparation and DC HF CCVD process, carbon nanotubes (CNTs), carbon nanofibers (CNFs), carbon nanowalls (CNWs), carbon nanoparticles (CNPs) with different orientation of the graphene plans or shells can be prepared. From the angular dependence of the incident light and geometrical morphology of the nanostructures, wide variations of the C K - edge intensity of the transitions to the empty \(\pi\)* and \(\sigma\)* states occur. A full lineshape analysis of the XAS spectra has been carried out using a home -made soft - ware, allowing estimating the relative proportion of \(\pi\)* and \(\sigma\)* transitions. A geometrical model of the angular dependence with the incidence angle of the light and the morphology of the carbon nanostructures is derived. With normalization to the HOPG (Highly Oriented Pyrolytic Graphite) reference case, a degree of alignment can be extracted which is representative of the localized orientation of the graphitic carbon \(\pi\) bonds, accounting not only for the overall orientation, but also for local defects like impurities incorporation, structural defects,… This degree of alignment shows good agreement with SEM observations. Thus CNTs films display degrees of alignment around 50%, depending on the occurrence of defects in the course of the growth, whereas no special alignment can be detected with CNFs and CNPs, and a weak one (about 20%) is detected on CNWs.