M. Agrasar, J.R. Hernandez, F. Uriondo
{"title":"数值继电器的仿真与暂态测试","authors":"M. Agrasar, J.R. Hernandez, F. Uriondo","doi":"10.1109/MCAP.2002.1046113","DOIUrl":null,"url":null,"abstract":"ISSN 0895-0156/02/$17.00©2002 IEEE To what extent is the use of transient tests prevalent in the policy of utilities: Acceptance tests Incidence analysis New modular relay definitions Optimal settings Corrective maintenance Relay selection? The main incentive of our research was to tackle the development of diverse tools that, in conjunction, made it possible to establish conclusions to answer this question.","PeriodicalId":435675,"journal":{"name":"IEEE Computer Applications in Power","volume":"95 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Simulation and transient testing of numerical relays\",\"authors\":\"M. Agrasar, J.R. Hernandez, F. Uriondo\",\"doi\":\"10.1109/MCAP.2002.1046113\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"ISSN 0895-0156/02/$17.00©2002 IEEE To what extent is the use of transient tests prevalent in the policy of utilities: Acceptance tests Incidence analysis New modular relay definitions Optimal settings Corrective maintenance Relay selection? The main incentive of our research was to tackle the development of diverse tools that, in conjunction, made it possible to establish conclusions to answer this question.\",\"PeriodicalId\":435675,\"journal\":{\"name\":\"IEEE Computer Applications in Power\",\"volume\":\"95 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-12-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Computer Applications in Power\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MCAP.2002.1046113\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Computer Applications in Power","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MCAP.2002.1046113","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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