由电树生长引起的电击穿过程的模型

R. Bozzo, F. Guastavino, D. Tommasini
{"title":"由电树生长引起的电击穿过程的模型","authors":"R. Bozzo, F. Guastavino, D. Tommasini","doi":"10.1109/ICSD.1989.69231","DOIUrl":null,"url":null,"abstract":"The authors develop a mathematical model that can describe the electrical breakdown due to electrical treeing growth in point-plane electrode specimens of thermoplastic polymers subjected to AC voltage ramps. The damage due to the tree growth is modeled as a conductive sphere, allowing an easy computation of the geometrical field in front of it. The breakdown voltage V/sub BD/, the radius of the sphere R/sub b/, and the electric field on the sphere AE/sub b/ are related by means of the simple equation V/sub BD/(D)=AE/sub b/*R/sub b/(D), where D is the interelectrode gap. The model has been verified experimentally.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A model of the electrical breakdown process due to electrical treeing growth\",\"authors\":\"R. Bozzo, F. Guastavino, D. Tommasini\",\"doi\":\"10.1109/ICSD.1989.69231\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors develop a mathematical model that can describe the electrical breakdown due to electrical treeing growth in point-plane electrode specimens of thermoplastic polymers subjected to AC voltage ramps. The damage due to the tree growth is modeled as a conductive sphere, allowing an easy computation of the geometrical field in front of it. The breakdown voltage V/sub BD/, the radius of the sphere R/sub b/, and the electric field on the sphere AE/sub b/ are related by means of the simple equation V/sub BD/(D)=AE/sub b/*R/sub b/(D), where D is the interelectrode gap. The model has been verified experimentally.<<ETX>>\",\"PeriodicalId\":184126,\"journal\":{\"name\":\"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-07-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSD.1989.69231\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSD.1989.69231","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

作者开发了一个数学模型,可以描述由于电树生长在热塑性聚合物的点平面电极样品受到交流电压斜坡的电击穿。由于树木生长造成的损伤被建模为一个导电球体,这样可以很容易地计算出它前面的几何场。击穿电压V/sub BD/、球半径R/sub b/、球上电场AE/sub b/的关系式为:V/sub BD/(D)=AE/sub b/*R/sub b/(D),其中D为电极间隙。该模型已通过实验验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A model of the electrical breakdown process due to electrical treeing growth
The authors develop a mathematical model that can describe the electrical breakdown due to electrical treeing growth in point-plane electrode specimens of thermoplastic polymers subjected to AC voltage ramps. The damage due to the tree growth is modeled as a conductive sphere, allowing an easy computation of the geometrical field in front of it. The breakdown voltage V/sub BD/, the radius of the sphere R/sub b/, and the electric field on the sphere AE/sub b/ are related by means of the simple equation V/sub BD/(D)=AE/sub b/*R/sub b/(D), where D is the interelectrode gap. The model has been verified experimentally.<>
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