0.18 μm CMOS中ΔΣ分数n锁相环电荷泵电流失配校正技术

W. Chiu, Tai-Shun Chang, Tsung-Hsien Lin
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引用次数: 8

摘要

这项工作提出了一种用于Delta-Sigma分数n锁相环的电荷泵(CP)校准技术(ΣΔ-FNPLL)。所提出的校准方法在CP电路中引入辅助路径,利用每个参考周期内的一定间隔来检测失配,然后校正上下电流差。将所提出的CP校准方法应用于2.4 ghz ΣΔ-FNPLL的设计中。实验结果表明,激活该方法能显著降低带内相位噪声和分数杂散。整个ΣΔ-FNPLL采用台积电0.18 μm CMOS工艺制造,从1.8 v电源消耗23 mW。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A charge pump current missmatch calibration technique for ΔΣ fractional-N PLLs in 0.18-μm CMOS
This work presents a charge pump (CP) calibration technique for a Delta-Sigma fractional-N phase-locked loop (ΣΔ-FNPLL). The proposed calibration method introduces an auxiliary path to the CP circuit and utilizes some interval within each reference cycle to detect the mismatch and then correct the up/down current difference. The proposed CP calibration is employed in the design of a 2.4-GHz ΣΔ-FNPLL. The experimental result has demonstrated that the in-band phase noise and fractional spurs are significantly reduced when the proposed CP calibration is activated. Fabricated in a TSMC 0.18-μm CMOS process, the whole ΣΔ-FNPLL consumes 23 mW from a 1.8-V supply.
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