{"title":"电容耦合半桥或全桥正激变换器中的变压器饱和和异常系统振荡:原因、分析和处理","authors":"R. Redl, N. Sokal, C.W. Schaefer","doi":"10.1109/PESC.1988.18213","DOIUrl":null,"url":null,"abstract":"In capacitively coupled bridge converters, duty-ratio unbalanced can cause transformer saturation and resulting transistor destruction. Independently, modulation of the transistor storage time by variations of collector current can cause low-frequency system oscillation which leads also to transformer saturation, and additionally causes low-frequency conducted EMI which is difficult to filter. A resistor shunting the coupling capacitor is suggested as a simple but effective cure for both problems. Mathematical analyses for both phenomena, a design procedure for selecting the proper value of shunt resistance, and experimental results that confirm the analyses are presented.<<ETX>>","PeriodicalId":283605,"journal":{"name":"PESC '88 Record., 19th Annual IEEE Power Electronics Specialists Conference","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"33","resultStr":"{\"title\":\"Transformer saturation and unusual system oscillation in capacitively coupled half-bridge or full-bridge forward converters: causes, analyses, and cures\",\"authors\":\"R. Redl, N. Sokal, C.W. Schaefer\",\"doi\":\"10.1109/PESC.1988.18213\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In capacitively coupled bridge converters, duty-ratio unbalanced can cause transformer saturation and resulting transistor destruction. Independently, modulation of the transistor storage time by variations of collector current can cause low-frequency system oscillation which leads also to transformer saturation, and additionally causes low-frequency conducted EMI which is difficult to filter. A resistor shunting the coupling capacitor is suggested as a simple but effective cure for both problems. Mathematical analyses for both phenomena, a design procedure for selecting the proper value of shunt resistance, and experimental results that confirm the analyses are presented.<<ETX>>\",\"PeriodicalId\":283605,\"journal\":{\"name\":\"PESC '88 Record., 19th Annual IEEE Power Electronics Specialists Conference\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-04-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"33\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"PESC '88 Record., 19th Annual IEEE Power Electronics Specialists Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PESC.1988.18213\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"PESC '88 Record., 19th Annual IEEE Power Electronics Specialists Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PESC.1988.18213","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Transformer saturation and unusual system oscillation in capacitively coupled half-bridge or full-bridge forward converters: causes, analyses, and cures
In capacitively coupled bridge converters, duty-ratio unbalanced can cause transformer saturation and resulting transistor destruction. Independently, modulation of the transistor storage time by variations of collector current can cause low-frequency system oscillation which leads also to transformer saturation, and additionally causes low-frequency conducted EMI which is difficult to filter. A resistor shunting the coupling capacitor is suggested as a simple but effective cure for both problems. Mathematical analyses for both phenomena, a design procedure for selecting the proper value of shunt resistance, and experimental results that confirm the analyses are presented.<>