Kaori Kikuchi, B. Lamond, A. Ghosh, P. Peers, P. Debevec
{"title":"自由偏振球面照明反射计","authors":"Kaori Kikuchi, B. Lamond, A. Ghosh, P. Peers, P. Debevec","doi":"10.1145/1899950.1899971","DOIUrl":null,"url":null,"abstract":"We present a prototype system for in-situ measurement of per-pixel appearance parameters (i.e., surface orientation, diffuse albedo, specular albedo, and specular roughness) of general scenes. The proposed system requires no specialized hardware, is light weight, and requires no on-site calibration. This makes our system particularly well suited for capturing the appearance of real-world scenes under uncontrolled conditions.","PeriodicalId":354911,"journal":{"name":"ACM SIGGRAPH ASIA 2010 Sketches","volume":"195 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-12-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Free-form polarized spherical illumination reflectometry\",\"authors\":\"Kaori Kikuchi, B. Lamond, A. Ghosh, P. Peers, P. Debevec\",\"doi\":\"10.1145/1899950.1899971\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present a prototype system for in-situ measurement of per-pixel appearance parameters (i.e., surface orientation, diffuse albedo, specular albedo, and specular roughness) of general scenes. The proposed system requires no specialized hardware, is light weight, and requires no on-site calibration. This makes our system particularly well suited for capturing the appearance of real-world scenes under uncontrolled conditions.\",\"PeriodicalId\":354911,\"journal\":{\"name\":\"ACM SIGGRAPH ASIA 2010 Sketches\",\"volume\":\"195 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-12-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACM SIGGRAPH ASIA 2010 Sketches\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/1899950.1899971\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACM SIGGRAPH ASIA 2010 Sketches","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1899950.1899971","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
We present a prototype system for in-situ measurement of per-pixel appearance parameters (i.e., surface orientation, diffuse albedo, specular albedo, and specular roughness) of general scenes. The proposed system requires no specialized hardware, is light weight, and requires no on-site calibration. This makes our system particularly well suited for capturing the appearance of real-world scenes under uncontrolled conditions.
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